Soft X-ray absorption spectroscopy study of the effects of Si, Ce, and Mo ion implantation on the passive layer of AISI 304 stainless steel

被引：20
作者：
López, MF
Gutiérrez, A
Pérez, FJ
Hierro, MP
Pedraza, F
机构：
[1] CSIC, Inst Ciencia Mat Madrid, E-28049 Madrid, Spain
[2] Univ Autonoma Madrid, Dept Fis Aplicada, E-28049 Madrid, Spain
[3] Univ Complutense Madrid, Fac Ciencias Quim, Dept Ciencia Mat, E-28040 Madrid, Spain
来源：
CORROSION SCIENCE | 2003年 / 45卷 / 09期
关键词：
stainless steel; ion implantation; passive films;
D O I：
10.1016/S0010-938X(03)00029-5
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
The chemical modifications introduced in the passive layer of AISI 304 stainless steel after Si, Ce, and Mo ion implantation were investigated and compared with non-implanted steel by soft X-ray absorption spectroscopy. The influence of ion implantation on the passive properties was evaluated by measuring soft X-ray absorption spectra at the Cr, Fe, Ni, Mn and Si 2p in addition to oxygen Is thresholds. All ion implanted samples show a relative Cr-enrichment at the surface as compared with non-implanted samples. Fe 2p as well as 0 1s spectral changes reveal chemical differences in the passive layer as a function of the element ion-implanted. (C) 2003 Elsevier Science Ltd. All rights reserved.
引用
收藏
页码：2043 / 2053
页数：11
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