Continuum x-ray source as a calibration system for charge coupled devices

被引:12
作者
Hashimotodani, K
Toneri, T
Kitamoto, S
Tsunemi, H
Hayashida, K
Miyata, E
Katayama, K
Kohomura, T
Asakura, R
Koyama, K
Yamamoto, K
Miyaguchi, K
Suzuki, H
机构
[1] Osaka Univ, Grad Sch Sci, Dept Earth & Space Sci, Toyonaka, Osaka 560, Japan
[2] Japan Sci & Technol Corp, CREST, Kawaguchi, Saitama 332, Japan
[3] Kyoto Univ, Grad Sch Sci, Dept Phys, Kyoto 60601, Japan
[4] Hamamatsu Photon KK, Hamamatsu, Shizuoka 435, Japan
关键词
D O I
10.1063/1.1148671
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
We present x-ray spectra obtained by a charge coupled device (CCD) from an electron impacting x-ray source using several kinds of electron targets: Au, Al-bronze, Al, and pure Al. The x rays from the source are dispersed by a grating and the dispersed x rays are focused on the CCD. Owing to the fine spatial and moderate energy resolutions of the CCD, fine spectra with 2 eV energy resolution up to 2.2 keV are obtained. X rays from the purl Al target (99.999% purity) provide good continuum x rays except for Al K x rays. This continuum source is useful as a calibration source for low energy x-ray detectors. (C) 1998 American Institute of Physics.
引用
收藏
页码:392 / 395
页数:4
相关论文
共 6 条
[1]   THE X-RAY-ENERGY RESPONSE OF SILICON .A. THEORY [J].
FRASER, GW ;
ABBEY, AF ;
HOLLAND, A ;
MCCARTHY, K ;
OWENS, A ;
WELLS, A .
NUCLEAR INSTRUMENTS & METHODS IN PHYSICS RESEARCH SECTION A-ACCELERATORS SPECTROMETERS DETECTORS AND ASSOCIATED EQUIPMENT, 1994, 350 (1-2) :368-378
[2]  
GENGREAU K, 1995, THESIS MIT
[3]   VARIABLE LINE-SPACE GRATINGS - NEW DESIGNS FOR USE IN GRAZING-INCIDENCE SPECTROMETERS [J].
HETTRICK, MC ;
BOWYER, S .
APPLIED OPTICS, 1983, 22 (24) :3921-3924
[4]   ABERRATIONS OF VARIED LINE-SPACE GRAZING-INCIDENCE GRATINGS IN CONVERGING LIGHT-BEAMS [J].
HETTRICK, MC .
APPLIED OPTICS, 1984, 23 (18) :3221-3235
[5]   PERFORMANCE OF THE CHARGE-COUPLED DEVICE FOR DIRECT X-RAY-DETECTION IN THE ENERGY-RANGE OF 1-9 KEV AT THE SYNCHROTRON RADIATION FACILITY [J].
TSUNEMI, H ;
KAWAI, S ;
HAYASHIDA, K .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1991, 30 (06) :1299-1302
[6]   New technique of the X-ray efficiency measurement of a charge-coupled device with a subpixel resolution [J].
Tsunemi, H ;
Yoshita, K ;
Kitamoto, S .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS, 1997, 36 (5A) :2906-2911