Stripline resonator method to measure complex permittivity of dielectric substrate as a function of temperature

被引：0
|
作者：
Guo Gaofeng [1 ]
Li En [1 ]
Xu Zengchao [1 ]
Zhou Yang [1 ]
Zhang Qishao [1 ]
机构：
[1] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 610054, Peoples R China
来源：
ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS | 2007年
关键词：
stripline resonator; microwave dielectric substrate; complex permittivity; microwave measurement;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A measurement equipment is designed in the paper to measure the complex permittivity of microwave dielectric substrate as the temperature changes from room temperature to 150 degrees centigrade. The range of working frequency is from I GHz to 10 GHz. The range of permittivity is from 1.5 to 20. And the range of loss angle tangent is from 5.0e-4 to 1.0e-2. The measurement theory is introduced and the measurement result of a sample is also showed in the paper.
引用
收藏
页码：1908 / 1910
页数：3
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