Stripline resonator method to measure complex permittivity of dielectric substrate as a function of temperature

被引：0
|
作者：
Guo Gaofeng [1 ]
Li En [1 ]
Xu Zengchao [1 ]
Zhou Yang [1 ]
Zhang Qishao [1 ]
机构：
[1] Univ Elect Sci & Technol China, Sch Elect Engn, Chengdu 610054, Peoples R China
来源：
ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS | 2007年
关键词：
stripline resonator; microwave dielectric substrate; complex permittivity; microwave measurement;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A measurement equipment is designed in the paper to measure the complex permittivity of microwave dielectric substrate as the temperature changes from room temperature to 150 degrees centigrade. The range of working frequency is from I GHz to 10 GHz. The range of permittivity is from 1.5 to 20. And the range of loss angle tangent is from 5.0e-4 to 1.0e-2. The measurement theory is introduced and the measurement result of a sample is also showed in the paper.
引用
收藏
页码：1908 / 1910
页数：3
相关论文
共 50 条
  • [1] Perturbation method to measure complex permittivity of low loss dielectric material by stripline resonant cavity
    Li En
    Li Zhongping
    He Fengmei
    Guo Gaofeng
    Zhang Qishao
    ISTM/2007: 7TH INTERNATIONAL SYMPOSIUM ON TEST AND MEASUREMENT, VOLS 1-7, CONFERENCE PROCEEDINGS, 2007, : 1904 - 1907
  • [2] A dielectric resonator for measurements of complex permittivity of low loss dielectric materials as a function of temperature
    Krupka, J
    Derzakowski, K
    Riddle, B
    Baker-Jarvis, J
    MEASUREMENT SCIENCE AND TECHNOLOGY, 1998, 9 (10) : 1751 - 1756
  • [3] MEASUREMENT ACCURACY OF COMPLEX PERMITTIVITY IN THE DIELECTRIC ROD RESONATOR METHOD
    TAKAGI, H
    FUJINAMI, N
    TAMURA, H
    WAKINO, K
    JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 1992, 31 (9B): : 3269 - 3271
  • [4] Measurement accuracy of complex permittivity in the dielectric rod resonator method
    Takagi, Hitoshi, 1600, (31):
  • [5] Differential open resonator method for permittivity measurements of thin dielectric film on substrate
    Dudorov, SN
    Lioubtchenko, DV
    Mallat, JA
    Räisänen, AV
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2005, 54 (05) : 1916 - 1920
  • [6] A Dielectric Loaded Resonator for the Measurement of the Complex Permittivity of Dielectric Substrates
    Alimenti, Andrea
    Pittella, Erika
    Torokhtii, Kostiantyn
    Pompeo, Nicola
    Piuzzi, Emanuele
    Silva, Enrico
    IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 2023, 72
  • [7] Measurement of complex permittivity of moist sawdust by perturbation method with a dielectric ring resonator
    Chen, ZY
    Zhang, YJ
    Okamura, S
    TESTING, RELIABILITY, AND APPLICATION OF MICRO- AND NANO-MATERIAL SYSTEMS, 2003, 5045 : 266 - 271
  • [8] Multimode analytical method for measuring frequency property of complex permittivity of dielectric resonator
    Univ of Electronic Science and, Technology of China, Chengdu, China
    Tien Tzu Hsueh Pao/Acta Electronica Sinica, 1997, 25 (03): : 10 - 13
  • [9] A Nondestructive Method for Measurements of Complex Permittivity of Microwave Dielectric Substrate Materials
    Zhao, Fei
    Xu, Pei
    Sha, Changtao
    Wang, Wenfeng
    Kan, Jinsong
    PROCEEDINGS OF THE 3RD INTERNATIONAL CONFERENCE ON MATERIAL, MECHANICAL AND MANUFACTURING ENGINEERING, 2015, 27 : 968 - 971
  • [10] BROADBAND COMPLEX PERMITTIVITY MEASUREMENT OF LOW LOSS MATERIALS OVER LARGE TEMPERATURE RANGES BY STRIPLINE RESONATOR CAVITY USING SEGMENTATION CALCULATION METHOD
    Zhou, Y.
    Li, E.
    Guo, G.
    Gao, Y.
    Yang, T.
    PROGRESS IN ELECTROMAGNETICS RESEARCH-PIER, 2011, 113 : 143 - 160
12345