Determination of Trace Elements in Wheat Flour by X-Ray Fluorescence Analysis and Its Application to Identification of Their Production Area

被引：8

作者：

Otaka, Akiko ^{[1
]}

Yanada, Yoko ^{[1
]}

Hokura, Akiko ^{[2
]}

Matsuda, Kenji ^{[3
]}

Nakai, Izumi ^{[1
]}

机构：

[1] Tokyo Univ Sci, Fac Sci, Dept Appl Chem, Shinjuku Ku, Tokyo 1628601, Japan

[2] Tokyo Denki Univ, Fac Engn, Dept Green & Sustainable Chem, Chiyoda Ku, Tokyo 1018457, Japan

[3] Spectris Corp, PANalyt Div, Minato Ku, Tokyo 1050013, Japan

来源：

BUNSEKI KAGAKU | 2009年 / 58卷 / 12期

关键词：

X-ray fluorescence analysis; trace elements; geographic origin; forensic science; multivariate analysis; ICP-MS; SPECTROMETRY; MULTIELEMENT; ORIGIN; FOOD;

D O I：

10.2116/bunsekikagaku.58.1011

中图分类号：

O65 [分析化学];

学科分类号：

070302 ; 081704 ;

摘要：

Trace elements in wheat flour were determined by an X-ray fluorescence (XRF) analysis in order to identify their production area. By optimizing the measurement conditions of an energy-dispersive XRF spectrometer equipped with 3-dimentional polarization optics, the analysis of heavy elements at sub-ppm levels was possible, and linear calibration curves for 17 elements (Na, Mg, Al, P, S, Cl, K, Ca, Mn, Fe, Cu, Zn, Br, Rb, Sr, Mo, Cd) in wheat flour were obtained. We determined the trace elements for 63 wheat flour samples that were produced in Japan or imported from overseas. The analytical results were subjected to multivariate analysis to discriminate the domestic and imported wheat flours. Principal-components analysis successfully distinguished the two origins. The present study has demonstrated that the XRF technique can provide a rapid and easy way for the provenance analysis of wheat flours, which will be further applied to the quality control of commercial food products.

引用

页码：1011 / 1022

页数：12

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