Role of pO2 and film microstructure on the memristive properties of La2NiO4+δ/LaNiO3-δ bilayers

被引:6
作者
Maas, Klaasjan [1 ]
Wulles, Chloe [1 ,2 ,3 ]
Caicedo Roque, Jose Manuel [2 ,3 ]
Ballesteros, Belen [2 ,3 ]
Lafarge, Valentin [1 ,2 ,3 ]
Santiso, Jose [2 ,3 ]
Burriel, Monica [1 ]
机构
[1] Univ Grenoble Alpes, LMGP, Grenoble INP, CNRS, F-38000 Grenoble, France
[2] CSIC, Catalan Inst Nanosci & Nanotechnol ICN2, Campus UAB, Barcelona 08193, Spain
[3] Barcelona Inst Sci & Technol BIST, Campus UAB, Barcelona 08193, Spain
基金
欧盟地平线“2020”;
关键词
TRANSPORT-PROPERTIES; OXYGEN DIFFUSION; THIN-FILMS;
D O I
10.1039/d1ta10296f
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
LaNiO3/La2NiO4 bilayers deposited at varying pO(2) conditions resulted in remarkable differences in film microstructure and cell parameters, directly affecting the electrical behaviour of Pt/LaNiO3/La2NiO4/Pt devices. The devices deposited at low pO(2) showed the largest memristance. We propose this is due to the formation of a p-type Schottky contact between LaNiO3 and La2NiO4, where the extent of its carrier depletion width can be modulated by the electric-field induced drift of interstitial oxygen ions acting as mobile acceptor dopants in La2NiO4.
引用
收藏
页码:6523 / 6530
页数:9
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