Determination of the glass transition temperature in thin polymeric films used for microelectronic packaging by temperature-dependent spectroscopic ellipsometry

被引:12
|
作者
Bittrich, Eva [1 ]
Windrich, Frank [2 ,3 ]
Martens, Dominik [1 ,4 ]
Bittrich, Lars [1 ]
Haeussler, Liane [1 ]
Eichhorn, Klaus-Jochen [1 ]
机构
[1] Leibniz Inst Polymerforsch Dresden eV, Dresden, Germany
[2] Fraunhofer IZM, Ctr All Silicon Syst Integrat Dresden, Moritzburg, Germany
[3] Tech Univ Dresden, Organ Chem Polymers, Dresden, Germany
[4] New Mexico State Univ, Las Cruces, NM 88003 USA
关键词
Glass transition; Polyimide; Thin film; Spectroscopic ellipsometry; POLYSTYRENE;
D O I
10.1016/j.polymertesting.2017.09.030
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
We characterized the glass transition temperature T-g of thin polyimide films by temperature-dependent spectroscopic ellipsometry and compared the results to DSC measurements of the bulk polymer. The effect of the curing temperature on T-g and the thermal expansion alpha(T) was analyzed. An improved ellipsometric data evaluation was used to get most precise and reliable T-g data. T-g increased with increasing curing temperature, while the bulk T-g was considerably lower than the thin film T-g. Both observations are attributed to the temperature sensitive release of the imidization by-product 2-hydroxyethyl methacrylate (HEMA) and crosslinker components as well as decomposition products from the material. Variation in the curing temperatures of 230-380 degrees C led to an increase in the T-g of 34 degrees C. (C) 2017 Elsevier Ltd. All rights reserved.
引用
收藏
页码:48 / 54
页数:7
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