Ultrathin Y2O3(111) films on Pt(111) substrates

被引:19
作者
Tao, Junguang [1 ]
Batzill, Matthias [1 ]
机构
[1] Univ S Florida, Dept Phys, Tampa, FL 33620 USA
基金
美国国家科学基金会;
关键词
Scanning tunneling microscopy; Growth; Low index single crystal surfaces; EPITAXIAL ZRO2 FILMS; OXIDE-FILMS; THIN-FILMS; GROWTH; MONOLAYER; OXIDATION; SURFACES; BEHAVIOR; RU(0001); SUPPORT;
D O I
10.1016/j.susc.2011.06.021
中图分类号
O64 [物理化学(理论化学)、化学物理学];
学科分类号
070304 ; 081704 ;
摘要
The growth of ultrathin films of Y2O3(111) on Pt(111) has been studied using scanning tunneling microscopy (STM). X-ray photoemission spectroscopy (XPS), and low energy electron diffraction (LEED). The films were grown by physical vapor deposition of yttrium in a 10(-6) Torr oxygen atmosphere. Continuous Y2O3(111) films were obtained by post-growth annealing at 700 degrees C. LEED and STM indicate an ordered film with a bulk-truncated Y2O3(111)-1 x 1 structure exposed. Furthermore, despite the lattices of the substrate and the oxide film being incommensurate, the two lattices exhibit a strict in-plane orientation relationship with the [1 (1) over bar0] directions of the two cubic lattices aligning parallel to each other. XPS measurements suggest hydroxyls to be easily formed at the Y2O3 surface at room temperature even under ultra high vacuum conditions. The hydrogen desorbs from the yttria surface above similar to 200 degrees C. (C) 2011 Elsevier B.V. All rights reserved.
引用
收藏
页码:1826 / 1833
页数:8
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