Stability analysis of self-injection-locked oscillators

被引：37

作者：

Chang, HC ^{[1
]}

机构：

[1] Blue 7 Commun Inc, Fremont, CA 94538 USA

来源：

IEEE TRANSACTIONS ON MICROWAVE THEORY AND TECHNIQUES | 2003年 / 51卷 / 09期

关键词：

AM noise; delay line; feedback loop; injection lock; noise; oscillator; parallel resonant; phase (PM) noise; resonator; self-injection lock; series resonant; stability;

D O I：

10.1109/TMTT.2003.815863

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

This paper addresses the stability analysis of the self-injection-locked oscillators. The analysis is developed for arbitrary self-injection feedback loops and illustrated with the specific case of a simple, time-delay cable: It is shown that the output phase stability in self-injection-locked oscillators depends on the feedback. loop delay and the types of oscillator circuits, which are represented by equivalent parallel- or series, resonant oscillator models. The self-injection-locked technique can also be used to test the oscillator circuit model when the self-coupling phase is known: The theory is verified by using a self-injection-locked GaAs MESFET oscillator operating at X-band with delay loops.

引用

收藏

页码：1989 / 1993

页数：5

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