Picosecond laser microscopy for investigating localization of alpha particle induced soft error rates in deep submicron CMOS VLSI

被引：1
|
作者：
Laird, J. S. [1 ]
Chen, Y. [1 ]
机构：
[1] CALTECH, Jet Prop Lab, Pasadena, CA 91109 USA
来源：
2008 IEEE INTERNATIONAL RELIABILITY PHYSICS SYMPOSIUM PROCEEDINGS - 46TH ANNUAL | 2008年
关键词：
alpha particle; soft error rate; picosecond laser microscopy; deep-submicron CMOS; charge sharing;
D O I：
10.1109/RELPHY.2008.4559011
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
引用
收藏
页码：731 / 732
页数：2
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