Pinhole interferometry with coherent hard X-rays

被引:39
作者
Leitenberger, W
Wendrock, H
Bischoff, L
Weitkamp, T
机构
[1] Univ Potsdam, Inst Phys, D-14469 Potsdam, Germany
[2] Inst Festkorper & Werkstoffforsch, D-01171 Dresden, Germany
[3] Forschungszentrum Rossendorf EV, D-01314 Dresden, Germany
[4] Paul Scherrer Inst, CH-5232 Villigen, Switzerland
关键词
coherent X-rays; double-slit interferometer; point diffraction interferometer; refraction index; white synchrotron beam;
D O I
10.1107/S0909049503029169
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
This paper discusses the experimental realisation of two types of X-ray interferometer based on pinhole diffraction. In both interferometers the beam splitter was a thin metal foil containing micrometer pinholes to divide the incident X-ray wave into two coherent waves. The interference pattern was studied using an energy-dispersive detector to simultaneously investigate in a large spectral range the diffraction properties of the white synchrotron radiation. For a highly absorbing pinhole mask the interference fringes from the classical Young's double-pinhole experiment were recorded and the degree of coherence of X-rays could be determined. In the case of low absorption of the metal foil at higher X-ray energies (> 15 keV) the interference pattern of a point diffraction interferometer was observed using the same set-up. The spectral refraction index of the metal foil was determined.
引用
收藏
页码:190 / 197
页数:8
相关论文
共 41 条
[1]   Temperature- and time-resolved X-ray scattering at thin organic films [J].
Bodenthin, Y ;
Grenzer, J ;
Lauter, R ;
Pietsch, U ;
Lehmann, P ;
Kurth, DG ;
Möhwald, H .
JOURNAL OF SYNCHROTRON RADIATION, 2002, 9 :206-209
[2]  
Born M., 1999, PRINCIPLES OPTICS
[3]   Optical source model for the 23.2-23.6 nm radiation from the multielement germanium soft X-ray laser [J].
Burge, RE ;
Yuan, XC ;
Slark, GE ;
Browne, MT ;
Charalambous, P ;
Lewis, CLS ;
Cairns, GF ;
MacPhee, AG ;
Neely, D .
OPTICS COMMUNICATIONS, 1999, 169 (1-6) :123-133
[4]   Spatial coherence characterization of undulator radiation [J].
Chang, C ;
Naulleau, P ;
Anderson, E ;
Attwood, D .
OPTICS COMMUNICATIONS, 2000, 182 (1-3) :25-34
[5]   Phase objects in synchrotron radiation hard x-ray imaging [J].
Cloetens, P ;
Barrett, R ;
Baruchel, J ;
Guigay, JP ;
Schlenker, M .
JOURNAL OF PHYSICS D-APPLIED PHYSICS, 1996, 29 (01) :133-146
[6]  
David C, 2000, AIP CONF PROC, V507, P704, DOI 10.1063/1.1291236
[7]   Spatial coherence measurement of soft x-ray radiation produced by high order harmonic generation [J].
Ditmire, T ;
Gumbrell, ET ;
Smith, RA ;
Tisch, JWG ;
Meyerhofer, DD ;
Hutchinson, MHR .
PHYSICAL REVIEW LETTERS, 1996, 77 (23) :4756-4759
[8]  
FRANCON M, 1966, OPTICAL INTERFEROMET
[9]   Distinguishing between Fraunhofer and Fresnel diffraction by the Young's experiment [J].
García-Sucerquia, JI ;
Castañeda, R ;
Medina, FF ;
Matteucci, G .
OPTICS COMMUNICATIONS, 2001, 200 (1-6) :15-22
[10]   Progress towards lambda/20 extreme ultraviolet interferometry [J].
Goldberg, KA ;
Beguiristain, R ;
Bokor, J ;
Medecki, H ;
Attwood, DT ;
Jackson, K ;
Tejnil, E ;
Sommargren, GE .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1995, 13 (06) :2923-2927