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Reliability Analysis of Warm Standby Systems using Sequential BDD
被引:0
作者:
Tannous, Ola
[1
]
Xing, Liudong
[1
]
Dugan, Joanne Bechta
[1
]
机构:
[1] SE Massachusetts Univ, Dept Elect & Comp Engn, N Dartmouth, MA 02747 USA
来源:
ANNUAL RELIABILITY AND MAINTAINABILITY SYMPOSIUM (RAMS), 2011 PROCEEDINGS
|
2011年
关键词:
dynamic fault tree (DFT);
sequential binary decision diagram (SBDD);
warm spare;
OBDD-BASED EVALUATION;
NETWORK RELIABILITY;
SENSITIVITY;
D O I:
暂无
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
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页数:7
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