Experimental method to determine the absolute efficiency curve of a wavelength dispersive spectrometer

被引：17
|
作者：
Trincavelli, Jorge [1 ,2 ]
Limandri, Silvina [1 ,2 ]
Carreras, Alejo [2 ,3 ]
Bonetto, Rita [2 ,4 ,5 ]
机构：
[1] Ciudad Univ, Fac Matemat Astron & Fis, Univ Nacl Cordoba, RA-5000 Cordoba, Argentina
[2] Ciudad Univ, Consejo Nacl Invest Cient & Tecn Republ Argentina, RA-5000 Cordoba, Argentina
[3] Univ Nacl San Luis, Inst Invest & Tecnol Quim, RA-5700 San Luis, Argentina
[4] UNLP, Ctr Invest & Desarrollo Ciencias Aplicadas Dr Jor, Fac Ciencias Exactas, RA-1900 La Plata, Argentina
[5] UNLP, Fac Ingn, RA-1900 La Plata, Argentina
来源：
MICROSCOPY AND MICROANALYSIS | 2008年 / 14卷 / 04期
关键词：
detection efficiency; wavelength dispersive X-ray spectrometer; electron probe microanalysis; standardless microanalysis;
D O I：
10.1017/S1431927608080379
中图分类号：
T [工业技术];
学科分类号：
08 ;
摘要：
A method for the experimental determination of the absolute efficiency of wavelength dispersive spectrometers was developed, based on the comparison of spectra measured with a wavelength dispersive system and with an energy dispersive spectrometer. The aim of studying this parameter arises because its knowledge is necessary to perform standardless analysis. A simple analytical expression was obtained for the efficiency curve for three crystals (TAP, PET, and LiF) of the spectrometer used, within an energy range from 0.77 to 10.83 keV. Although this expression is particular for the system used in this work, the method may be extended to other spectrometers and crystals for electron probe microanalysis and X-ray fluorescence.
引用
收藏
页码：306 / 314
页数：9
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