Researching on 3-dimensional acceleration testing method for packaging

被引：0

作者：

Zhao, QH ^{[1
]}

Zhang, HY ^{[1
]}

Chen, WY ^{[1
]}

机构：

[1] Xian Univ Technol, Xian 710048, Shaanxi, Peoples R China

来源：

ISTM/2005: 6th International Symposium on Test and Measurement, Vols 1-9, Conference Proceedings | 2005年

关键词：

memorizing and testing technology; acquisition; transport packaging; single chip;

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

The research is based on memorizing and testing technology with the hardware SCM P87LPC769 and memory At24C256, which construct an intelligent 3-D acceleration meter The meter can record 3 dimensional acceleration data in whole packaging transportation process, and automatically realizes data acquisition and memorizing according to acceleration variations. The memorized data can be read out by PC when package is opened. The diagram of operation and software flowchart are demonstrated in the article. Key words: Memorizing and testing technology, acquisition, transport packaging, single chip

引用

页码：4041 / 4043

页数：3