Broadband microwave and time-domain terahertz spectroscopy of chemical vapor deposition grown graphene

被引:26
|
作者
Liu, W. [1 ]
Aguilar, R. Valdes [1 ]
Hao, Yufeng [2 ,3 ]
Ruoff, R. S. [2 ,3 ]
Armitage, N. P. [1 ]
机构
[1] Johns Hopkins Univ, Dept Phys & Astron, Baltimore, MD 21218 USA
[2] Univ Texas Austin, Dept Mech Engn, Austin, TX 78712 USA
[3] Univ Texas Austin, Mat Sci & Engn Program, Austin, TX 78712 USA
关键词
LAYER GRAPHENE; LARGE-AREA; GAS; FILMS;
D O I
10.1063/1.3651168
中图分类号
O59 [应用物理学];
学科分类号
摘要
We report a study of the complex AC impedance of chemical vapor deposition grown graphene. We measure the explicit frequency dependence of the complex impedance and conductance over the microwave and terahertz range of frequencies using our recently developed broadband microwave Corbino and time domain terahertz spectrometers (TDTS). We demonstrate how one may resolve a number of technical difficulties in measuring the intrinsic impedance of the graphene layer that this frequency range presents, such as distinguishing contributions to the impedance from the substrate. From our microwave measurements, the AC impedance has little dependance on temperature and frequency down to liquid helium temperatures. The small contribution to the imaginary impedance comes from either a remaining residual contribution from the substrate or a small deviation of the conductance from the Drude form. (C) 2011 American Institute of Physics. [doi:10.1063/1.3651168]
引用
收藏
页数:5
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