Optical and structural properties of self-assembled ZnO nanocrystals

被引:0
作者
Hur, TB
Hwang, YH
Kim, HK [1 ]
Lee, IJ
机构
[1] Pusan Natl Univ, Dept Phys, Pusan 609735, South Korea
[2] Pusan Natl Univ, Res Ctr Dielect Adv Matter Phys, Pusan 609735, South Korea
[3] Pohang Univ Sci & Technol, Pohang Accelerator Lab, Pohang 790784, South Korea
关键词
ZnO; photoluminescence; nanocrystals;
D O I
暂无
中图分类号
O4 [物理学];
学科分类号
0702 ;
摘要
Self-assembled ZnO nanocrystals were fabricated by using a RF-magnetron sputtering system. The average diameters of the nanocrystals with different deposition times were roughly 41 urn and 62 nm. The nanocrystals had a preferred orientation to c-axis in the surface-normal direction, but were disordered in the in-plane direction. Photoluminescence measurements of the nanocrystals revealed an intense UV peak at 3.380 eV at 15 K (with a width of 65 meV), which corresponds to the free exciton energy.
引用
收藏
页码:120 / 123
页数:4
相关论文
共 18 条
[1]   Optically pumped lasing of ZnO at room temperature [J].
Bagnall, DM ;
Chen, YF ;
Zhu, Z ;
Yao, T ;
Koyama, S ;
Shen, MY ;
Goto, T .
APPLIED PHYSICS LETTERS, 1997, 70 (17) :2230-2232
[2]   Clustering on surfaces at finite areal coverages [J].
Barel, R ;
Mai, Y ;
Carlow, GR ;
ZinkeAllmang, M .
APPLIED SURFACE SCIENCE, 1996, 104 :669-678
[3]   Control of thickness and orientation of solution-grown silicon nanowires [J].
Holmes, JD ;
Johnston, KP ;
Doty, RC ;
Korgel, BA .
SCIENCE, 2000, 287 (5457) :1471-1473
[4]   Chemistry and physics in one dimension: Synthesis and properties of nanowires and nanotubes [J].
Hu, JT ;
Odom, TW ;
Lieber, CM .
ACCOUNTS OF CHEMICAL RESEARCH, 1999, 32 (05) :435-445
[5]   Critical thickness of AlN thin film grown on Al2O3(0001) [J].
Kim, JW ;
Hwang, YH ;
Cho, JH ;
Kim, HK .
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS SHORT NOTES & REVIEW PAPERS, 2001, 40 (07) :4677-4679
[6]  
Kim JY, 2004, J KOREAN PHYS SOC, V44, P137
[7]   Selective formation of ZnO nanodots on nanopatterned substrates by metalorganic chemical vapor deposition [J].
Kim, SW ;
Kotani, T ;
Ueda, M ;
Fujita, S ;
Fujita, S .
APPLIED PHYSICS LETTERS, 2003, 83 (17) :3593-3595
[8]   Synchrotron x-ray scattering study on the evolution of surface morphology of the InN/Al2O3(0001) system [J].
Lee, IJ ;
Kim, JW ;
Hur, TB ;
Hwang, YH ;
Kim, HK .
APPLIED PHYSICS LETTERS, 2002, 81 (03) :475-477
[9]  
Ohring M., 1992, Materials Science of Thin Films, DOI 10.1016/B978-0-12-524975-1.X5000-9
[10]  
Shan FK, 2003, J KOREAN PHYS SOC, V42, pS1174