Quantitative differential phase contrast (DPC) microscopy with computational aberration correction

Differential Phase Contrast (DPC) microscopy is a practical method for recovering quantitative phase from intensity images captured with different source patterns in an LED array microscope. Being a partially coherent imaging method, DPC does not suffer from speckle artifacts and achieves 2x better resolution than coherent methods. Like all imaging systems, however, DPC is susceptible to aberrations. Here, we propose a method of algorithmic self-calibration for DPC where we simultaneously recover the complex-field of the sample and the spatially-variant aberrations of the system, using 4 images with different illumination source patterns. The resulting phase reconstructions are digitally aberration-corrected. (C) 2018 Optical Society of America under the terms of the OSA Open Access Publishing Agreement