A CMOS APS for dental X-ray imaging using scintillating sensors

被引:6
作者
Abdalla, MA [1 ]
Fröjdh, C
Petersson, CS
机构
[1] Mid Sweden Univ, ITE, S-85170 Sundsvall, Sweden
[2] Kungi tekniska Hogskolan, Inst Elect, S-16440 Kista, Sweden
关键词
X-ray imaging; pixel detectors; readout electronics; CMOS APS; radiation imaging; photosensor; integrating pixel;
D O I
10.1016/S0168-9002(00)01114-1
中图分类号
TH7 [仪器、仪表];
学科分类号
0804 ; 080401 ; 081102 ;
摘要
In this paper we present an integrating CMOS Active Pixel Sensor (APS) circuit to be used with scintillator type X-ray sensors for intra oral dental X-ray imaging systems. Different pixel architectures were constructed to explore their performance characteristics and to study the feasibility of the development of such systems using the CMOS technology. A prototype 64 x 80 pixel array has been implemented in a CMOS 0.8 mum double poly n-well process with a pixel pitch of 50 mum. A spectral sensitivity measurement for the different pixels topologies, as well as measured X-ray direct absorption in the different APSs are presented. A measurement of the output signal showed a good linearity over a wide dynamic range. This chip showed that the very low sensitivity of the CMOS APSs to direct X-ray exposure adds a great advantage to the various CMOS advantages over CCD-based imaging systems, (C) 2001 Elsevier Science B.V. All rights reserved.
引用
收藏
页码:197 / 203
页数:7
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