Improvement of noise characteristics in super-resolution near-field structure disc

被引:3
|
作者
Hwang, I [1 ]
Kim, J [1 ]
Bae, J [1 ]
Kim, HK [1 ]
Yoon, D [1 ]
Park, I [1 ]
Shin, D [1 ]
机构
[1] Samsung Elect Co Ltd, Digital Media R&D Ctr, Suwon 442742, South Korea
来源
JAPANESE JOURNAL OF APPLIED PHYSICS PART 1-REGULAR PAPERS BRIEF COMMUNICATIONS & REVIEW PAPERS | 2005年 / 44卷 / 5B期
关键词
super-RENS; signal fluctuation; low frequency noise (LFN); W-Si recording layer; Te super-resolution layer;
D O I
10.1143/JJAP.44.3542
中图分类号
O59 [应用物理学];
学科分类号
摘要
The research interest in super-resolution near-field structure (Super-RENS) technology is shifting from the signal intensity (carrier-to-noise ratio, CNR) to the signal uniformity (jitter or bER). To achieve uniform signal characteristics, it is important to reduce signal fluctuation in the super-RENS disc. In this study, we investigated the relationship between signal fluctuation and low-frequency noise (LFN), and analyzed the LFN increase in recording and readout processes. It was found that signal fluctuation had a close relationship with LFN. It was also found that certain recorded mark shapes, such a bubble shape, and high readout power increased the LFN during recording and readout processes of a super-RENS disc. Therefore, using non bubble-type recording material and low super-resolution readout material, we markedly improved the LFN of a super-RENS disc.
引用
收藏
页码:3542 / 3546
页数:5
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