Pervasive artifacts revealed from magnetometry measurements of rare earth-transition metal thin films

被引:9
作者
Mandru, Andrada-Oana [1 ]
Yildirim, Oguz [1 ]
Marioni, Miguel A. [1 ]
Rohrmann, Hartmut [2 ]
Heigl, Michael [3 ]
Ciubotariu, Oana-Tereza [3 ]
Penedo, Marcos [1 ]
Zhao, Xue [2 ]
Albrecht, Manfred [3 ]
Hug, Hans J. [1 ,4 ]
机构
[1] Empa, Swiss Fed Labs Mat Sci & Technol, CH-8600 Dubendorf, Switzerland
[2] Evatec AG, CH-9477 Trubbach, Switzerland
[3] Univ Augsburg, Inst Phys, D-86135 Augsburg, Germany
[4] Univ Basel, Dept Phys, CH-4056 Basel, Switzerland
来源
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A | 2020年 / 38卷 / 02期
基金
瑞士国家科学基金会;
关键词
MAGNETIC-PROPERTIES; ANISOTROPY; TBFE; FE;
D O I
10.1116/1.5135504
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
A class of artifacts manifesting as soft magnetic components are revealed from magnetometry measurements of rare earth-transition metal (TbFe) thin films prepared by magnetron sputtering. They are not inherent to TbFe, but are a direct result of the manner in which the substrates are mounted prior to sample fabrication, with a material deposited at the substrate sides giving rise to a significant magnetic moment. The authors find the same artifacts to also be present in rare earth-free [Co/Pt] multilayers. Trying to supress the appearance of this type of artifact has an influence on the coercivity and, in some cases, on the shape of the reversal curves. Care needs to be taken during fabrication to ensure reliable and reproducible samples so that sensitive magnetic parameters, such as coercivity and compensation points, can be extracted accurately and that data are not misinterpreted for even more complex systems. This type of artifact is not limited to samples prepared by sputtering but can extend to other conventional thin-film deposition methods.
引用
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页数:7
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