JOURNAL OF VACUUM SCIENCE & TECHNOLOGY A
|
2020年
/
38卷
/
02期
基金:
瑞士国家科学基金会;
关键词:
MAGNETIC-PROPERTIES;
ANISOTROPY;
TBFE;
FE;
D O I:
10.1116/1.5135504
中图分类号:
TB3 [工程材料学];
学科分类号:
0805 ;
080502 ;
摘要:
A class of artifacts manifesting as soft magnetic components are revealed from magnetometry measurements of rare earth-transition metal (TbFe) thin films prepared by magnetron sputtering. They are not inherent to TbFe, but are a direct result of the manner in which the substrates are mounted prior to sample fabrication, with a material deposited at the substrate sides giving rise to a significant magnetic moment. The authors find the same artifacts to also be present in rare earth-free [Co/Pt] multilayers. Trying to supress the appearance of this type of artifact has an influence on the coercivity and, in some cases, on the shape of the reversal curves. Care needs to be taken during fabrication to ensure reliable and reproducible samples so that sensitive magnetic parameters, such as coercivity and compensation points, can be extracted accurately and that data are not misinterpreted for even more complex systems. This type of artifact is not limited to samples prepared by sputtering but can extend to other conventional thin-film deposition methods.
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Indian Inst Sci, Dept Mat Engn, Bangalore 560012, Karnataka, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Basumatary, Himalay
Chelvane, J. Arout
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h-index: 0
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Chelvane, J. Arout
Rao, D. V. Sridhara
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h-index: 0
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Rao, D. V. Sridhara
Kamat, S. V.
论文数: 0引用数: 0
h-index: 0
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
机构:
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Lafayette Coll, Dept Phys, Easton, PA 18042 USANIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Boekelheide, Z.
Dennis, C. L.
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Indian Inst Sci, Dept Mat Engn, Bangalore 560012, Karnataka, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Basumatary, Himalay
Chelvane, J. Arout
论文数: 0引用数: 0
h-index: 0
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Chelvane, J. Arout
Rao, D. V. Sridhara
论文数: 0引用数: 0
h-index: 0
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
Rao, D. V. Sridhara
Kamat, S. V.
论文数: 0引用数: 0
h-index: 0
机构:
Def Met Res Lab, Hyderabad 500258, Andhra Pradesh, IndiaDef Met Res Lab, Hyderabad 500258, Andhra Pradesh, India
机构:
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Lafayette Coll, Dept Phys, Easton, PA 18042 USANIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA
Boekelheide, Z.
Dennis, C. L.
论文数: 0引用数: 0
h-index: 0
机构:
NIST, Mat Measurement Lab, Gaithersburg, MD 20899 USANIST, Mat Measurement Lab, Gaithersburg, MD 20899 USA