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Ultrafast electron energy-loss spectroscopy in transmission electron microscopy
被引:23
|作者:
Pomarico, Enrico
[1
]
Kim, Ye-Jin
[2
]
Javier Garcia de Abajo, F.
[3
]
Kwon, Oh-Hoon
[4
]
Carbone, Fabrizio
[1
]
van der Veen, Renske M.
[5
,6
]
机构:
[1] Ecole Polytech Fed Lausanne, Lausanne, Switzerland
[2] Ulsan Natl Inst Sci & Technol, Ulsan, South Korea
[3] Inst Ciencies Foton, Barcelona, Spain
[4] Ulsan Natl Inst Sci & Technol, Dept Chem, Ulsan, South Korea
[5] Univ Illinois, Dept Chem, Urbana, IL USA
[6] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL USA
基金:
瑞士国家科学基金会;
关键词:
electron energy-loss spectroscopy (EELS);
laser-induced reaction;
nanoscale;
electronic structure;
optical properties;
NEAR-FIELD;
IN-SITU;
DIFFRACTION;
DYNAMICS;
RESOLUTION;
SURFACE;
MODE;
D O I:
10.1557/mrs.2018.148
中图分类号:
T [工业技术];
学科分类号:
08 ;
摘要:
In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.
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页码:497 / 503
页数:7
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