Ultrafast electron energy-loss spectroscopy in transmission electron microscopy

被引：23

作者：

Pomarico, Enrico ^{[1
]}

Kim, Ye-Jin ^{[2
]}

Javier Garcia de Abajo, F. ^{[3
]}

Kwon, Oh-Hoon ^{[4
]}

Carbone, Fabrizio ^{[1
]}

van der Veen, Renske M. ^{[5
,6
]}

机构：

[1] Ecole Polytech Fed Lausanne, Lausanne, Switzerland

[2] Ulsan Natl Inst Sci & Technol, Ulsan, South Korea

[3] Inst Ciencies Foton, Barcelona, Spain

[4] Ulsan Natl Inst Sci & Technol, Dept Chem, Ulsan, South Korea

[5] Univ Illinois, Dept Chem, Urbana, IL USA

[6] Univ Illinois, Frederick Seitz Mat Res Lab, Urbana, IL USA

来源：

MRS BULLETIN | 2018年 / 43卷 / 07期

基金：

瑞士国家科学基金会;

关键词：

electron energy-loss spectroscopy (EELS); laser-induced reaction; nanoscale; electronic structure; optical properties; NEAR-FIELD; IN-SITU; DIFFRACTION; DYNAMICS; RESOLUTION; SURFACE; MODE;

D O I：

10.1557/mrs.2018.148

中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

In the quest for dynamic multimodal probing of a material's structure and functionality, it is critical to be able to quantify the chemical state on the atomic-/nanoscale using element-specific electronic and structurally sensitive tools such as electron energy-loss spectroscopy (EELS). Ultrafast EELS, with combined energy, time, and spatial resolution in a transmission electron microscope, has recently enabled transformative studies of photoexcited nanostructure evolution and mapping of evanescent electromagnetic fields. This article aims to describe state-of-the-art experimental techniques in this emerging field and its major uses and future applications.

引用

页码：497 / 503

页数：7

共 59 条

[1] Four-Dimensional Ultrafast Electron Microscopy: Insights into an Emerging Technique [J].