Observation of Electrospun Nanofiber Surface by Atomic Force Microscopy

被引:0
作者
Sakamoto, Hiroaki
Suye, Shin-Ichiro
机构
关键词
D O I
暂无
中图分类号
TB3 [工程材料学]; TS1 [纺织工业、染整工业];
学科分类号
0805 ; 080502 ; 0821 ;
摘要
引用
收藏
页码:207 / 207
页数:1
相关论文
共 50 条
[21]   ATOMIC-FORCE MICROSCOPY OBSERVATION OF SI(100) SURFACE AFTER HYDROGEN ANNEALING [J].
YANASE, Y ;
HORIE, H ;
OKA, Y ;
SANO, M ;
SUMITA, S ;
SHIGEMATSU, T .
JOURNAL OF THE ELECTROCHEMICAL SOCIETY, 1994, 141 (11) :3259-3263
[22]   Atomic force microscopy observation of highly arrayed phospholipid bilayer vesicle on a gold surface [J].
Jung, HoSup ;
Kim, JongMin ;
Park, JongWan ;
Lee, SangEun ;
Lee, HeaYeon ;
Kuboi, Ryoichi ;
Kawai, Tomoji .
JOURNAL OF BIOSCIENCE AND BIOENGINEERING, 2006, 102 (01) :28-33
[23]   Direct observation of antifreeze glycoproteins on hydrophobic surface using atomic force microscopy. [J].
DiVirgilio, ES ;
Sarno, DM ;
Murphy, AV ;
Jones, WE ;
Ben, RN .
ABSTRACTS OF PAPERS OF THE AMERICAN CHEMICAL SOCIETY, 2001, 222 :U123-U123
[24]   Topographical observation of silane-treated inorganic surface using atomic force microscopy [J].
Nakamura, Y ;
Yokouchi, N ;
Tobita, Y ;
Iida, T ;
Nagata, K .
COMPOSITE INTERFACES, 2005, 12 (07) :669-681
[25]   Atomic vacancy-induced friction on the graphite surface:: observation by lateral force microscopy [J].
Paredes, JI ;
Martínez-Alonso, A ;
Tascón, JMD .
JOURNAL OF MICROSCOPY, 2003, 210 :119-124
[26]   Observation of a photochemical reaction on the TiO2 (110) surface by atomic force microscopy [J].
Sawunyama, P ;
Fujishima, A ;
Hashimoto, K .
CHEMICAL COMMUNICATIONS, 1998, (20) :2229-2230
[27]   Observation of bainite surface reliefs in Fe-C alloy by atomic force microscopy [J].
Yang, ZG ;
Zhang, C ;
Bai, BZ ;
Fang, HS .
MATERIALS LETTERS, 2001, 48 (05) :292-298
[28]   OBSERVATION OF THE SURFACE MORPHOLOGY OF CARBON ALLOY CATALYSTS IN AQUEOUS SOLUTION BY ATOMIC FORCE MICROSCOPY [J].
Ishii, Takafumi ;
Miyamoto, Masaya ;
Ozaki, Jun-ichi .
CARBON, 2025, 233
[29]   DIRECT OBSERVATION OF THE ATOMIC-FORCE MICROSCOPY TIP USING INVERSE ATOMIC-FORCE MICROSCOPY IMAGING [J].
MONTELIUS, L ;
TEGENFELDT, JO ;
VANHEEREN, P .
JOURNAL OF VACUUM SCIENCE & TECHNOLOGY B, 1994, 12 (03) :2222-2226
[30]   Methodological peculiarities of DNA observation by atomic force microscopy [J].
Prokhorov, VV ;
Klinov, DV ;
Demin, VV .
BIOORGANICHESKAYA KHIMIYA, 1999, 25 (03) :237-240