RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

被引：28
|
作者：
Beale, T. A. W. [1 ]
Hase, T. P. A. [2 ]
Iida, T. [3 ]
Endo, K. [3 ]
Steadman, P. [4 ]
Marshall, A. R. [4 ]
Dhesi, S. S. [4 ]
van der Laan, G. [4 ]
Hatton, P. D. [1 ]
机构：
[1] Univ Durham, Dept Phys, Durham DH1 3LE, England
[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[3] Toyama Co Ltd, Zama, Kanagawa 2520003, Japan
[4] Diamond Light Source Ltd, Didcot OX11 0DE, Oxon, England
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 07期
基金：
英国工程与自然科学研究理事会;
关键词：
RESONANT MAGNETIC SCATTERING; ACTIVE PIXEL SENSOR; EXCHANGE SCATTERING; BRAGG-DIFFRACTION; MULTILAYERS; DIFFRACTOMETER; ANISOTROPY; EDGES; FILMS; IRON;
D O I：
10.1063/1.3458004
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2 theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3458004]
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页数：9
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