RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

被引：28

作者：

Beale, T. A. W. ^{[1
]}

Hase, T. P. A. ^{[2
]}

Iida, T. ^{[3
]}

Endo, K. ^{[3
]}

Steadman, P. ^{[4
]}

Marshall, A. R. ^{[4
]}

Dhesi, S. S. ^{[4
]}

van der Laan, G. ^{[4
]}

Hatton, P. D. ^{[1
]}

机构：

[1] Univ Durham, Dept Phys, Durham DH1 3LE, England

[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England

[3] Toyama Co Ltd, Zama, Kanagawa 2520003, Japan

[4] Diamond Light Source Ltd, Didcot OX11 0DE, Oxon, England

来源：

REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 07期

基金：

英国工程与自然科学研究理事会;

关键词：

RESONANT MAGNETIC SCATTERING; ACTIVE PIXEL SENSOR; EXCHANGE SCATTERING; BRAGG-DIFFRACTION; MULTILAYERS; DIFFRACTOMETER; ANISOTROPY; EDGES; FILMS; IRON;

D O I：

10.1063/1.3458004

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2 theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3458004]

引用

页数：9

共 50 条

[21] Reflectivity and stability of Cr/Sc multilayers for the soft X-ray
Yulin, S
Kuhlmann, T
Feigl, T
Kaiser, N
X-RAY MIRRORS, CRYSTALS, AND MULTILAYERS II, 2002, 4782 : 285 - 291
[22] Image plate X-ray diffraction and X-ray reflectivity characterization of protective coatings and thin films
Lee, SL
Windover, D
Doxbeck, M
Nielsen, M
Kumar, A
Lu, TM
THIN SOLID FILMS, 2000, 377 : 447 - 454
[23] Characterization of InGaN/GaN and AlGaN/GaN superlattices by X-ray diffraction and X-ray reflectivity measurements
Sintonen, S.
Suihkonen, S.
Svensk, O.
Torma, P. T.
Ali, M.
Sopanen, M.
Lipsanen, H.
PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 7, NO 7-8, 2010, 7 (7-8):
[24] Protegrin interaction with lipid monolayers: grazing incidence X-ray diffraction and X-ray reflectivity study
Neville, Frances
Ishitsuka, Yuji
Hodges, Chris S.
Konovalov, Oleg
Waring, Alan J.
Lehrer, Robert
Lee, Ka Yee C.
Gidalevitz, David
SOFT MATTER, 2008, 4 (08) : 1665 - 1674
[25] Advanced resonant soft x-ray diffraction to study ordering phenomena in magnetic materials
Staub, Urs
POLARIZED NEUTRONS AND SYNCHROTRON X-RAYS FOR MAGNETISM CONFERENCE 2009, 2010, 211
[26] Measurement of reflectivity of X-ray mirror for Soft X-ray Telescope onboard ASTRO-H
Sugita, Satoshi
Furuzawa, Akihiro
Kazunori, Ishibashi
Tamura, Keisuke
Okajima, Takashi
Maeda, Yoshitomo
Sato, Takuro
Ichihara, Kou
Tomikawa, Kazuki
Iizuka, Ryo
Awaya, Takashi
Okada, Kohta
SPACE TELESCOPES AND INSTRUMENTATION 2012: ULTRAVIOLET TO GAMMA RAY, 2012, 8443
[27] X-ray characterization of thin foil gold mirrors of a soft X-ray telescope for ASTROSATCharacterization of SXT mirrors by X-ray reflectivity
Archna Sagdeo
S. K. Rai
Gyan S. Lodha
K. P. Singh
Nisha Yadav
R. Dhawan
Umesh Tonpe
M. N. Vahia
Experimental Astronomy, 2010, 28 : 11 - 23
[28] Structures of nitridated layers on sapphire studied by x-ray reflectivity and diffraction
Kim, KS
Kim, SH
Lee, DR
APPLIED PHYSICS LETTERS, 2000, 76 (12) : 1552 - 1554
[29] X-ray diffraction and reflectivity studies of thin porous silicon layers
Buttard, D
Dolino, G
Bellet, D
Baumbach, T
ADVANCES IN MICROCRYSTALLINE AND NANOCRYSTALLINE SEMICONDUCTORS - 1996, 1997, 452 : 437 - 442
[30] X-RAY REFLECTIVITY AND DIFFRACTION STUDIES OF LIQUID SURFACES AND SURFACTANT MONOLAYERS
ALSNIELSEN, J
KJAER, K
PHASE TRANSITIONS IN SOFT CONDENSED MATTER, 1989, 211 : 113 - 138

← 1 2 3 4 5 →