RASOR: An advanced instrument for soft x-ray reflectivity and diffraction

被引：28
|
作者：
Beale, T. A. W. [1 ]
Hase, T. P. A. [2 ]
Iida, T. [3 ]
Endo, K. [3 ]
Steadman, P. [4 ]
Marshall, A. R. [4 ]
Dhesi, S. S. [4 ]
van der Laan, G. [4 ]
Hatton, P. D. [1 ]
机构：
[1] Univ Durham, Dept Phys, Durham DH1 3LE, England
[2] Univ Warwick, Dept Phys, Coventry CV4 7AL, W Midlands, England
[3] Toyama Co Ltd, Zama, Kanagawa 2520003, Japan
[4] Diamond Light Source Ltd, Didcot OX11 0DE, Oxon, England
来源：
REVIEW OF SCIENTIFIC INSTRUMENTS | 2010年 / 81卷 / 07期
基金：
英国工程与自然科学研究理事会;
关键词：
RESONANT MAGNETIC SCATTERING; ACTIVE PIXEL SENSOR; EXCHANGE SCATTERING; BRAGG-DIFFRACTION; MULTILAYERS; DIFFRACTOMETER; ANISOTROPY; EDGES; FILMS; IRON;
D O I：
10.1063/1.3458004
中图分类号：
TH7 [仪器、仪表];
学科分类号：
0804 ; 080401 ; 081102 ;
摘要：
We report the design and construction of a novel soft x-ray diffractometer installed at Diamond Light Source. The beamline endstation RASOR is constructed for general users and designed primarily for the study of single crystal diffraction and thin film reflectivity. The instrument is comprised of a limited three circle (theta, 2 theta, and chi) diffractometer with an additional removable rotation (phi) stage. It is equipped with a liquid helium cryostat, and post-scatter polarization analysis. Motorized motions are provided for the precise positioning of the sample onto the diffractometer center of rotation, and for positioning the center of rotation onto the x-ray beam. The functions of the instrument have been tested at Diamond Light Source, and initial test measurements are provided, demonstrating the potential of the instrument. (C) 2010 American Institute of Physics. [doi: 10.1063/1.3458004]
引用
收藏
页数：9
相关论文
共 50 条
  • [1] X-ray metrology by diffraction and reflectivity
    Bowen, DK
    Deslattes, RD
    CHARACTERIZATION AND METROLOGY FOR ULSI TECHNOLOGY 2000, INTERNATIONAL CONFERENCE, 2001, 550 : 570 - 579
  • [2] X-ray diffraction and X-ray reflectivity applied to investigation of thin films
    Rafaja, D
    ADVANCES IN SOLID STATE PHYSICS 41, 2001, 41 : 275 - 286
  • [3] REFLECTIVITY OF DIFFRACTION GRATINGS IN ULTRASOFT X-RAY REGION
    IVANOV, AV
    IZVESTIYA AKADEMII NAUK SSSR SERIYA FIZICHESKAYA, 1967, 31 (06): : 936 - &
  • [4] LEPTOS: A universal software for X-ray reflectivity and diffraction
    Ulyanenkov, A
    ADVANCES IN COMPUTATIONAL METHODS FOR X-RAY AND NEUTRON OPTICS, 2004, 5536 : 1 - 15
  • [5] A prototype handheld X-ray diffraction instrument
    Hansford, Graeme
    JOURNAL OF APPLIED CRYSTALLOGRAPHY, 2018, 51 : 1571 - 1585
  • [6] A prototype handheld X-ray diffraction instrument
    Hansford, Graeme (gmh14@leicester.ac.uk), 1600, Wiley-Blackwell, 5 Abbey Road, Chester, CH1 2HU, United Kingdom (51):
  • [7] INSTRUMENT FOR MEASUREMENT OF X-RAY DIFFRACTION PATTERNS
    BENNETT, JA
    REVIEW OF SCIENTIFIC INSTRUMENTS, 1949, 20 (12): : 908 - 910
  • [8] Measurements of the soft proton reflectivity on X-ray optics
    Diebold, S.
    Hess, B.
    Schmidt, L.
    Hanschke, S.
    Tenzer, C.
    Perinati, E.
    Santangelo, A.
    SPACE TELESCOPES AND INSTRUMENTATION 2024: ULTRAVIOLET TO GAMMA RAY, PT 1, 2024, 13093
  • [9] Anomalous X-ray diffraction with soft X-ray synchrotron radiation
    Carpentier, P
    Berthet-Colominas, C
    Capitan, M
    Chesne, ML
    Fanchon, E
    Lequien, S
    Stuhrmann, H
    Thiaudière, D
    Vicat, J
    Zielinski, P
    Kahn, R
    CELLULAR AND MOLECULAR BIOLOGY, 2000, 46 (05) : 915 - 935
  • [10] Carbon overcoatings for soft X-ray reflectivity enhancement
    Cotroneo, V.
    Spiga, D.
    Barbera, M.
    Bruni, R.
    Chen, K.
    Marcelli, C.
    Pareschi, G.
    Romaine, S.
    Zhao, Y. D.
    Zheng, L.
    Wu, Z. Y.
    OPTICS FOR EUV, X-RAY, AND GAMMA-RAY ASTRONOMY III, 2007, 6688
12345