COMPLEMENTARY SET VARIATIONAL AUTOENCODER FOR SUPERVISED ANOMALY DETECTION

Anomalies have broad patterns corresponding to their causes. In industry, anomalies are typically observed as equipment failures. Anomaly detection aims to detect such failures as anomalies. Although this is usually a binary classification task, the potential existence of unseen (unknown) failures makes this task difficult. Conventional supervised approaches are suitable for detecting seen anomalies but not for unseen anomalies. Although, unsupervised neural networks for anomaly detection now detect unseen anomalies well, they cannot utilize anomalous data for detecting seen anomalies even if some data have been made available. Thus, providing an anomaly detector that finds both seen and unseen anomalies well is still a tough problem. In this paper, we introduce a novel probabilistic representation of anomalies to solve this problem. The proposed model defines the normal and anomaly distributions using the analogy between a set and the complementary set. We applied these distributions to an unsupervised variational autoencoder (VAE)-based method and turned it into a supervised VAE-based method. We tested the proposed method with well-known data and real industrial data to show that the proposed method detects seen anomalies better than the conventional unsupervised method without degrading the detection performance for unseen anomalies.