Dielectric response measurements utilizing semi-square voltage waveforms

被引：44

作者：

Sonerud, Bjoern ^{[1
]}

Bengtsson, Tord ^{[1
,2
]}

Blennow, Joergen ^{[1
]}

Gubanski, Stanislaw M. ^{[1
]}

机构：

[1] Chalmers Univ Technol, Dept Mat & Mfg Technol, S-41296 Gothenburg, Sweden

[2] ABB Corp Res, S-72178 Vasteras, Sweden

来源：

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 2008年 / 15卷 / 04期

关键词：

dielectric measurements; discrete Fourier transforms; aging; monitoring; dielectric materials; insulation testing;

D O I：

10.1109/TDEI.2008.4591211

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

Dielectric response measurements belong to the group of diagnostic tools used for quality evaluation of high voltage insulation systems. A measurement system called Arbitrary Waveform Impedance Spectroscopy (AWIS) is presented here which is capable of utilizing the harmonic content of repetitive voltages with a semi-square waveform and the corresponding current response to perform dielectric response measurements. Extensive circuit modeling and calibrations are required in order to perform accurate measurements. AWIS could offer new possibilities, especially for continuous monitoring of the dielectric properties of high voltage components and systems. The accuracy of the technique in both low and high voltage applications is verified by comparison with results obtained by means of the Frequency Domain Spectroscopy (FDS) technique.

引用

页码：920 / 926

页数：7

共 18 条

[1] WINDOWS AND INTERPOLATION ALGORITHMS TO IMPROVE ELECTRICAL MEASUREMENT ACCURACY [J].

ANDRIA, G ;

SAVINO, M ;

TROTTA, A .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1989, 38 (04) :856-863

[2] Study of stress grading systems working under fast rise time pulses [J].

Espino-Cortes, F. P. ;

Montasser, Y. ;

Jayaram, S. H. ;

Cherney, E. A. .

CONFERENCE RECORD OF THE 2006 IEEE INTERNATIONAL SYMPOSIUM ON ELECTRICAL INSULATION, 2006, :380-+

[3]

Gäfvert U, 2000, PROCEEDINGS OF THE 6TH INTERNATIONAL CONFERENCE ON PROPERTIES AND APPLICATIONS OF DIELECTRIC MATERIALS, VOLS 1 & 2, P825, DOI 10.1109/ICPADM.2000.876357

[4] Analysis of ramped square-wave voltammetry in the frequency domain [J].

Gavaghan, DJ ;

Elton, D ;

Oldham, KB ;

Bond, AM .

JOURNAL OF ELECTROANALYTICAL CHEMISTRY, 2001, 512 (1-2) :1-15

[5]

HARRIS FJ, 1978, P IEEE, V66, P51, DOI 10.1109/PROC.1978.10837

[6]

HEDBERG J, 2005, NORD IS 05 TRONDH NO, P174

[7]

Helgeson A., 2000, THESIS ROYAL I TECHN

[8] HIGH-ACCURACY ANALOG MEASUREMENTS VIA INTERPOLATED FFT [J].

JAIN, VK ;

COLLINS, WL ;

DAVIS, DC .

IEEE TRANSACTIONS ON INSTRUMENTATION AND MEASUREMENT, 1979, 28 (02) :113-122

[9]

Oppenheim A. V., 1996, Signals & systems, V2nd

[10] Application of dielectric response measurement on power cable systems [J].

Oyegoke, B ;

Hyvonen, P ;

Aro, M ;

Gao, N .

IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION, 2003, 10 (05) :862-873

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