Dielectric response measurements utilizing semi-square voltage waveforms

被引：44
|
作者：
Sonerud, Bjoern [1 ]
Bengtsson, Tord [1 ,2 ]
Blennow, Joergen [1 ]
Gubanski, Stanislaw M. [1 ]
机构：
[1] Chalmers Univ Technol, Dept Mat & Mfg Technol, S-41296 Gothenburg, Sweden
[2] ABB Corp Res, S-72178 Vasteras, Sweden
来源：
IEEE TRANSACTIONS ON DIELECTRICS AND ELECTRICAL INSULATION | 2008年 / 15卷 / 04期
关键词：
dielectric measurements; discrete Fourier transforms; aging; monitoring; dielectric materials; insulation testing;
D O I：
10.1109/TDEI.2008.4591211
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Dielectric response measurements belong to the group of diagnostic tools used for quality evaluation of high voltage insulation systems. A measurement system called Arbitrary Waveform Impedance Spectroscopy (AWIS) is presented here which is capable of utilizing the harmonic content of repetitive voltages with a semi-square waveform and the corresponding current response to perform dielectric response measurements. Extensive circuit modeling and calibrations are required in order to perform accurate measurements. AWIS could offer new possibilities, especially for continuous monitoring of the dielectric properties of high voltage components and systems. The accuracy of the technique in both low and high voltage applications is verified by comparison with results obtained by means of the Frequency Domain Spectroscopy (FDS) technique.
引用
收藏
页码：920 / 926
页数：7
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