Poisson shock models leading to new classes of non-monotonic aging life distributions

被引：6
|
作者：
Pandey, Aniruddha [1 ]
Mitra, Murari [2 ]
机构：
[1] Seacom Engn Coll, Dept Math, Sankrail 711302, Howrah, India
[2] Bengal Engn & Sci Univ, Dept Math, Sibpur 711103, Howrah, India
来源：
MICROELECTRONICS RELIABILITY | 2011年 / 51卷 / 12期
关键词：
MEAN RESIDUAL LIFE; FAILURE RATE; SURVIVAL; BATHTUB; TREND;
D O I：
10.1016/j.microrel.2011.04.001
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Suppose a device is subjected to a sequence of shocks occurring randomly in time according to a homogeneous Poisson process. In this paper we introduce a class of non-monotonic aging distributions, the so-called New Worse then Better than Used in Failure Rate (NWBUFR) and New Worse then Better than Average Failure Rate (NWBAFR). It is shown under appropriate conditions on the probability of surviving a given number of shocks that the non-monotonic aging classes NWBUFR and NWBAFR arise from suitable Poisson shock models. (C) 2011 Elsevier Ltd. All rights reserved.
引用
收藏
页码：2412 / 2415
页数：4
相关论文
共 50 条
12345