X-ray diffraction method for determination of interplanar spacing and temperature distribution in crystals under an external temperature gradient

被引：12

作者：

Kocharyan, V. R. ^{[1
,2
]}

Gogolev, A. S. ^{[2
]}

Movsisyan, A. E. ^{[1
]}

Beybutyan, A. H. ^{[1
]}

Khlopuzyan, S. G. ^{[1
]}

Aloyan, L. R. ^{[3
,4
]}

机构：

[1] Inst Appl Problems Phys NAS RA, Yerevan 0014, Armenia

[2] Natl Res Tomsk Polytech Univ, Tomsk 634050, Russia

[3] Abdus Salam Int Ctr Theoret Phys, I-34151 Trieste, Italy

[4] Yerevan State Univ, Yerevan 0025, Armenia

来源：

JOURNAL OF APPLIED CRYSTALLOGRAPHY | 2015年 / 48卷

关键词：

X-ray diffraction; interplanar spacing; temperature distribution; external temperature gradients; INTERFERENCE; GEOMETRY;

D O I：

10.1107/S1600576715006913

中图分类号：

O6 [化学];

学科分类号：

0703 ;

摘要：

An X-ray diffraction method is developed for the determination of the distribution of temperature and interplanar spacing in a single-crystal plate. In particular, the temperature and the interplanar spacing differences in two different parts of a quartz single crystal of X-cut are experimentally determined depending on the value of the temperature gradient applied perpendicularly to the reflecting atomic planes (10 (1) over bar1). The temperature distribution along the direction perpendicular to the reflecting atomic planes (10 (1) over bar1) and the interplanar spacing distribution of atomic planes (10 (1) over bar1) are determined as well.

引用

页码：853 / 856

页数：4

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