Scanning Tunneling Microscopy and X-ray Photoelectron Spectroscopy Studies of Graphene Films Prepared by Sonication-Assisted Dispersion

被引：56
|
作者：
Polyakova , Elena Y. [1 ]
Rim, Kwang Taeg [2 ,3 ]
Eom, Daejin [3 ,4 ]
Douglass, Keith [5 ]
Opila, Robert L. [6 ]
Heinz, Tony F. [3 ,4 ]
Teplyakov, Andrew V. [5 ]
Flynn, George W. [2 ,3 ]
机构：
[1] Graphene Labs Inc, Reading, MA 01867 USA
[2] Columbia Univ, Dept Chem, New York, NY 10027 USA
[3] Columbia Univ, Nanoscale Sci & Engn Ctr, New York, NY 10027 USA
[4] Columbia Univ, Dept Phys, New York, NY 10027 USA
[5] Univ Delaware, Dept Chem & Biochem, Newark, DE 19716 USA
[6] Univ Delaware, Dept Mat Sci & Engn, Newark, DE 19716 USA
来源：
ACS NANO | 2011年 / 5卷 / 08期
基金：
美国国家科学基金会;
关键词：
graphene; sonication-assisted dispersion; scanning tunneling microscopy; X-ray photoelectron spectroscopy; GRAPHITE OXIDE; LARGE-AREA; SHEETS; HYDROGENATION; RESONATORS; NANOSCALE; TRANSPORT;
D O I：
10.1021/nn1009352
中图分类号：
O6 [化学];
学科分类号：
0703 ;
摘要：
We describe scanning tunneling microscopy and X-ray photoelectron spectroscopy studies of graphene films produced by sonication-assisted dispersion. Defects In these samples are not randomly distributed, and the graphene films exhibit a "patchwork" structure where unperturbed graphene areas are adjacent to heavily functionalized ones. Adjacent graphene layers are likely in poor mechanical contact due to adventitious species trapped between the carbon sheets of the sample.
引用
收藏
页码：6102 / 6108
页数：7
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