Hard-X-ray Phase-Difference Microscopy with a Low-Brilliance Laboratory X-ray Source

被引：27

作者：

Kuwabara, Hiroaki ^{[1
]}

Yashiro, Wataru ^{[1
]}

Harasse, Sebastien ^{[1
]}

Mizutani, Haruo ^{[2
]}

Momose, Atsushi ^{[1
]}

机构：

[1] Univ Tokyo, Grad Sch Frontier Sci, Dept Adv Mat Sci, Chiba 2778561, Japan

[2] Univ Tokyo, Sci Integrat Program, Org Interdisciplinary Res Projects, Chiba 2778568, Japan

来源：

APPLIED PHYSICS EXPRESS | 2011年 / 4卷 / 06期

基金：

日本科学技术振兴机构;

关键词：

HIGH-SPATIAL-RESOLUTION; CONTRAST; INTERFEROMETER;

D O I：

10.1143/APEX.4.062502

中图分类号：

O59 [应用物理学];

学科分类号：

摘要：

We have developed a hard-X-ray phase-imaging microscopy method using a low-brilliance X-ray source. The microscope consists of a sample, a Fresnel zone plate, a transmission grating, and a source grating creating an array of mutually incoherent X-ray sources. The microscope generates an image exhibiting twin features of the sample with opposite signs separated by a distance, which is processed to generate a phase image. The method is quantitative even for non-weak-phase objects that are difficult to be quantitatively examined by the widely used Zernike phase-contrast microscopy, and it has potentially broad applications in the material and biological science fields. (C) 2011 The Japan Society of Applied Physics

引用

页数：3

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