Dynamic fault diagnosis for sequential circuits on reconfigurable hardware

被引：2

作者：

Kocan, F ^{[1
]}

Saab, DG ^{[1
]}

机构：

[1] Case Western Reserve Univ, Dept Comp Engn & Sci, Cleveland, OH 44106 USA

来源：

INTERNATIONAL CONFERENCE ON COMPUTER DESIGN: VLSI IN COMPUTERS AND PROCESSORS, PROCEEDINGS | 1998年

关键词：

D O I：

10.1109/ICCD.1998.727051

中图分类号：

TP3 [计算技术、计算机技术];

学科分类号：

0812 ;

摘要：

In this paper, we introduce a new approach for locating and diagnosing faults in sequential circuits. The approach is based on automatically designing a circuit which implements a closestmatch fault location algorithm specialized for the sequential circuit under diagnosis. Our result shows an order of magnitude improvements in term of speeds over software based fault location.

引用

页码：214 / 215

页数：2