Elemental mappingwith an X-ray fluorescence imaging microscope

被引：0

作者：

Yamamoto, K ^{[1
]}

Watanabe, N ^{[1
]}

Takeuchi, A ^{[1
]}

Takano, H ^{[1
]}

Aota, T ^{[1
]}

Kumegawa, M ^{[1
]}

Ohigashi, T ^{[1
]}

Tanoue, R ^{[1
]}

Yokosuka, H ^{[1
]}

Aoki, S ^{[1
]}

机构：

[1] Univ Tsukuba, Inst Appl Phys, Tsukuba, Ibaraki 3058573, Japan

来源：

X-RAY MICROSCOPY, PROCEEDINGS | 2000年 / 507卷

关键词：

D O I：

暂无

中图分类号：

TH7 [仪器、仪表];

学科分类号：

0804 ; 080401 ; 081102 ;

摘要：

An X-ray fluorescence (XRF) imaging microscope with a Wolter-type grazing-incidence mirror as an objective was constructed at the beamline 39XU of SPring-8 (8GeV, 70mA) at Japan Synchrotron Radiation Institute. The monochromatic undulator X-rays in the energy range of 6-10keV were used to produce XRF of a specimen. The microscope system was set normal to the incident beam to reduce elastic scattering from a specimen and to improve signal/background ratio. The two-dimensional elemental mappings of a test specimen (Cu, Ni, Fe wires) and inclusions (Fe, Co, Ni) in a synthesized diamond could be obtained by utilizing the absorption edges of the corresponding elements.

引用

页码：259 / 262

页数：4

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