COLD SPRAY: ADVANCED CHARACTERIZATION METHODS-X-RAY PHOTOELECTRON SPECTROSCOPY, X-RAY FLUORESCENCE, AND AUGER ELECTRON SPECTROSCOPY

被引：0

作者：

Srinivasan, Dheepa

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来源：

ADVANCED MATERIALS & PROCESSES | 2019年 / 177卷 / 08期

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中图分类号：

T [工业技术];

学科分类号：

08 ;

摘要：

This article series explores the indispensable role of characterization in the development of cold spray coatings and illustrates some of the common processes used during coating development.

引用

页码：42 / 43

页数：2

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