Three-dimensional nanoscale imaging by plasmonic Brownian microscopy

被引:1
作者
Labno, Anna [2 ]
Gladden, Christopher [2 ]
Kim, Jeongmin [2 ]
Lu, Dylan [1 ]
Yin, Xiaobo [2 ]
Wang, Yuan [2 ,3 ]
Liu, Zhaowei [1 ]
Zhang, Xiang [2 ,3 ]
机构
[1] Univ Calif San Diego, Dept Elect & Comp Engn, 9500 Gilman Dr, San Diego, CA 92093 USA
[2] Univ Calif Berkeley, NSF Nanoscale Sci & Engn Ctr NSEC, 3112 Etcheverry Hall, Berkeley, CA 94720 USA
[3] Lawrence Berkeley Natl Lab, Mat Sci Div, 1 Cyclotron Rd, Berkeley, CA 94720 USA
关键词
3D nano-imaging; Brownian motion; microscopy; parallel scanning; evanescent field; FLUORESCENCE MICROSCOPY; LOCALIZATION ANALYSIS; OPTICAL MICROSCOPY; SUPERLENS; TWEEZERS; TRACKING; ARRAYS; PROBES; TIPS;
D O I
10.1515/nanoph-2017-0075
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
Three-dimensional (3D) imaging at the nanoscale is a key to understanding of nanomaterials and complex systems. While scanning probe microscopy (SPM) has been the workhorse of nanoscale metrology, its slow scanning speed by a single probe tip can limit the application of SPM to wide-field imaging of 3D complex nanostructures. Both electron microscopy and optical tomography allow 3D imaging, but are limited to the use in vacuum environment due to electron scattering and to optical resolution in micron scales, respectively. Here we demonstrate plasmonic Brownian microscopy (PBM) as a way to improve the imaging speed of SPM. Unlike photonic force microscopy where a single trapped particle is used for a serial scanning, PBM utilizes a massive number of plasmonic nanoparticles (NPs) under Brownian diffusion in solution to scan in parallel around the unlabeled sample object. The motion of NPs under an evanescent field is three-dimensionally localized to reconstruct the super-resolution topology of 3D dielectric objects. Our method allows high throughput imaging of complex 3D structures over a large field of view, even with internal structures such as cavities that cannot be accessed by conventional mechanical tips in SPM.
引用
收藏
页码:489 / 495
页数:7
相关论文
共 27 条
[1]   Micromachined Si cantilever arrays for parallel AFM operation [J].
Ahn, Yoomin ;
Ono, Takahito ;
Esashi, Masayoshi .
JOURNAL OF MECHANICAL SCIENCE AND TECHNOLOGY, 2008, 22 (02) :308-311
[2]   Imaging intracellular fluorescent proteins at nanometer resolution [J].
Betzig, Eric ;
Patterson, George H. ;
Sougrat, Rachid ;
Lindwasser, O. Wolf ;
Olenych, Scott ;
Bonifacino, Juan S. ;
Davidson, Michael W. ;
Lippincott-Schwartz, Jennifer ;
Hess, Harald F. .
SCIENCE, 2006, 313 (5793) :1642-1645
[3]   AFM probes with directly fabricated tips [J].
Boisen, A ;
Hansen, O ;
Bouwstra, S .
JOURNAL OF MICROMECHANICS AND MICROENGINEERING, 1996, 6 (01) :58-62
[4]   Time reversal three-dimensional imaging using single-cycle terahertz pulses [J].
Buma, T ;
Norris, TB .
APPLIED PHYSICS LETTERS, 2004, 84 (12) :2196-2198
[5]   Carbon nanotube atomic force microscopy tips: Direct growth by chemical vapor deposition and application to high-resolution imaging [J].
Cheung, CL ;
Hafner, JH ;
Lieber, CM .
PROCEEDINGS OF THE NATIONAL ACADEMY OF SCIENCES OF THE UNITED STATES OF AMERICA, 2000, 97 (08) :3809-3813
[6]   Three-dimensional parallel particle manipulation and tracking by integrating holographic optical tweezers and engineered point spread functions [J].
Conkey, Donald B. ;
Trivedi, Rahul P. ;
Pavani, Rama Prasanna ;
Smalyukh, Ivan I. ;
Piestun, Rafael .
OPTICS EXPRESS, 2011, 19 (05) :3835-3842
[7]   Three-dimensional imaging of single molecules solvated in pores of poly(acrylamide) gels [J].
Dickson, RM ;
Norris, DJ ;
Tzeng, YL ;
Moerner, WE .
SCIENCE, 1996, 274 (5289) :966-969
[8]   Ultrahigh-resolution full-field optical coherence tomography [J].
Dubois, A ;
Grieve, K ;
Moneron, G ;
Lecaque, R ;
Vabre, L ;
Boccara, C .
APPLIED OPTICS, 2004, 43 (14) :2874-2883
[9]   Near-field scanning optical microscopy [J].
Dunn, RC .
CHEMICAL REVIEWS, 1999, 99 (10) :2891-+
[10]  
Eaton P.J., 2014, Atomic force microscopy