Electron gun simulation using Opera-3D/2D

被引：0
|
作者：
Li, Hanyan [1 ]
Feng, Jinjun [1 ]
机构：
[1] Beijing Vacuum Elect Res Inst, Vacuum Elect Natl Lab, POb 749, Beijing 100016, Peoples R China
来源：
EIGHTH IEEE INTERNATIONAL VACUUM ELECTRONICS CONFERENCE | 2007年
关键词：
opera-3D/2D; electron gun; computer; simulation; normal sampling distance;
D O I：
暂无
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
In the paper, computer simulations are performed using Opera to evaluate and optimize electron guns. A normal sampling distance, a fiactor needed to be optimized, is discussed how to affect the results, as well as the simulation results are presented. After optimizing, the results show calculated parameters of electron guns are in good agreement with measured values except a variation of 12.5% in the corresponding waist position.
引用
收藏
页码：93 / +
页数：2
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