AFM probe tip and image reconstruction from noisy measurements

被引：0
|
作者：
Fischer, H [1 ]
Nittmann, J [1 ]
机构：
[1] DIGITAL EQUIPMENT OSTERREICH AG,CAMPUSBASED ENGN CTR VIENNA,A-1040 VIENNA,AUSTRIA
来源：
DIAGNOSTIC TECHNIQUES FOR SEMICONDUCTOR MATERIALS PROCESSING II | 1996年 / 406卷
关键词：
D O I：
暂无
中图分类号：
TB3 [工程材料学];
学科分类号：
0805 ; 080502 ;
摘要：
引用
收藏
页码：201 / 208
页数：8
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