The x-ray imaging system's requirements for CCD pixel

被引:0
作者
Yu, Chunyu [1 ,2 ]
Kong, Lingli [3 ]
Zhang, Junju [4 ]
He, Chunjiu [1 ]
Zhang, Shengdong [1 ]
机构
[1] Peking Univ, Shenzhen Grad Sch, Sch Informat Engn, Shenzhen 518055, Peoples R China
[2] Nanjing Univ Posts & Telecommun, Sch Optoelect Engn, Nanjing 210003, Peoples R China
[3] Shenzhen Invengo Informat Technol Co Ltd, Res & Dev Ctr, Shenzhen 518055, Peoples R China
[4] Nanjing Univ Sci & Technol, Sch Elect Engn & Opt Technol, Nanjing 210094, Peoples R China
来源
INTERNATIONAL SYMPOSIUM ON PHOTOELECTRONIC DETECTION AND IMAGING 2011: ADVANCES IN IMAGING DETECTORS AND APPLICATIONS | 2011年 / 8194卷
关键词
CCD; pixel requirement; x-ray imaging; imaging performance;
D O I
10.1117/12.899865
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
CCD technology has kept developing since CCD was invented and has very wide application in all kinds of imaging field. In the fields of security checking, non-destructive testing, and industry detection, CCD makes it possible that the digital radiography appears and accelerates the x-ray imaging performance improvement. So in this paper, CCD technology was introduce and its development was analyzed, then how it affect the x-ray imaging performance was conducted through the mathematical theory was model, which includes the pixel size and the pixel amount although the cooling condition is very important. This paper can be valuable and referential for designing an x-ray imaging system and it is the same for other kinds of imaging systems.
引用
收藏
页数:5
相关论文
共 4 条
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  • [2] Yu C.Y., 2005, OPTO ELECT ENG, V32, p57~59
  • [3] Yu C.Y., 2006, P SOC PHOTO-OPT INS, V6047, p6047W1~7
  • [4] [喻春雨 YU Chunyu], 2006, [光电工程, Opto-Electronic Engineering], V33, P120