Correlation of optical energy gap with the nearest neighbour short range order in amorphous V2O5 films

被引:4
作者
Dhawan, Sahil [1 ]
Vedeshwar, Agnikumar G. [1 ]
Tandon, R. P. [1 ]
机构
[1] Univ Delhi, Dept Phys & Astrophys, Thin Film Lab, Delhi 110007, India
关键词
X-RAY-DIFFRACTION; VANADIUM-OXIDES; GROWTH; NAV2O5;
D O I
10.1088/0022-3727/44/21/215404
中图分类号
O59 [应用物理学];
学科分类号
摘要
The optical and structural properties of well characterized vacuum-evaporated amorphous V2O5 films were studied in the thickness range 5-500 nm. The structural analyses show that V-O, O-O and V-V nearest neighbour distances defining the short range order vary nonlinearly with film thickness. The optical absorption shows thickness-dependent energy gap (E-g) and the nonlinear behaviour of thickness-dependent E-g is similar to that of nearest neighbour distance with film thickness. The E-g correlates linearly very well with all the three nearest neighbour distances. The variation of E-g with film thickness is attributed to the residual stress in the film which causes the changes in short range order. The change in E-g corresponding to the change in V-O distance was found to be 35 eV nm(-1). This change is almost three times of that with V-V distance.
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页数:6
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