A model for friction in atomic force microscopy

被引：0
|
作者：
Salapaka, S [1 ]
Dahleh, M [1 ]
机构：
[1] Univ Calif Santa Barbara, Dept Mech & Environm Engn, Santa Barbara, CA 93106 USA
来源：
PROCEEDINGS OF THE 2000 AMERICAN CONTROL CONFERENCE, VOLS 1-6 | 2000年
关键词：
mass-spring-damper model; JKR theory; AFMs; friction; control; tracking; stick-slip; differential inclusions;
D O I：
暂无
中图分类号：
TP [自动化技术、计算机技术];
学科分类号：
0812 ;
摘要：
A mass-spring-damper model has been presented to describe the cantilever-sample dynamics in Atomic Force Microscope (AFM). Friction has been incorporated in this model by using Johnson-Kendall-Roberts (JKR) theory for elastic contacts. It has been validated by exhibiting some characteristic features (such as stick-slip behavior) observed in experiments with AFM. A control law has been designed so that the piezoelectric tube in an AFM moves in a desired manner inspite of the friction. Simulation results have been presented to illustrate the model and performance of the controllers.
引用
收藏
页码：2102 / 2107
页数：6
相关论文
共 50 条
  • [31] Carbon nanotube as a probe for friction force microscopy
    Ishikawa, M
    Yoshimura, M
    Ueda, K
    PHYSICA B-CONDENSED MATTER, 2002, 323 (1-4) : 184 - 186
  • [32] Adhesion and friction studies of microsphere-patterned surfaces in contact with atomic force microscopy colloidal probe
    Zhang, Xiaoliang
    Lu, Yongjuan
    Liu, Eryong
    Yi, Gewen
    Jia, Junhong
    COLLOIDS AND SURFACES A-PHYSICOCHEMICAL AND ENGINEERING ASPECTS, 2012, 401 : 90 - 96
  • [33] Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy
    Arnab Bhattacharjee
    Nikolay T. Garabedian
    Christopher L. Evans
    David L. Burris
    Tribology Letters, 2020, 68
  • [34] Traceable Lateral Force Calibration (TLFC) for Atomic Force Microscopy
    Bhattacharjee, Arnab
    Garabedian, Nikolay T.
    Evans, Christopher L.
    Burris, David L.
    TRIBOLOGY LETTERS, 2020, 68 (04)
  • [35] Effects of Anisotropy and Substrate Shape on Atomic Friction Force in Two-Dimensional Model
    C. S. Takoutsing
    G. Djuidjé Kenmoé
    T. C. Kofané
    Tribology Letters, 2017, 65
  • [36] Effects of Anisotropy and Substrate Shape on Atomic Friction Force in Two-Dimensional Model
    Takoutsing, C. S.
    Kenmoe, G. Djuidje
    Kofane, T. C.
    TRIBOLOGY LETTERS, 2017, 65 (03)
  • [37] Atomic Defect Quantification by Lateral Force Microscopy
    Yang, Yucheng
    Xu, Kaikui
    Holtzman, Luke N.
    Yang, Kristyna
    Watanabe, Kenji
    Taniguchi, Takashi
    Hone, James
    Barmak, Katayun
    Rosenberger, Matthew R.
    ACS NANO, 2024, 18 (09) : 6887 - 6895
  • [38] Friction force studies on layered materials using an Atomic Force Microscope
    Klein, H
    Pailharey, D
    Mathey, Y
    SURFACE SCIENCE, 1997, 387 (1-3) : 227 - 235
  • [39] Atomic Force Microscopy of Transfer Film Development
    Shaffer, Kathryn E.
    Mccumiskey, Edward J.
    Krick, Brandon A.
    Ewin, Jeffrey J.
    Taylor, Curtis R.
    Junk, Christopher P.
    Blackman, Gregory S.
    Sawyer, W. Gregory
    Pitenis, Angela A.
    TRIBOLOGY LETTERS, 2024, 72 (03)
  • [40] Nanorheological Mapping of Rubbers by Atomic Force Microscopy
    Igarashi, Takaaki
    Fujinami, So
    Nishi, Toshio
    Asao, Naoki
    Nakajima, Ken
    MACROMOLECULES, 2013, 46 (05) : 1916 - 1922
12345