Self-Mixing Interference effect of VCSEL and the application on micro-displacement measurement

被引:1
作者
Hao, Hui [1 ]
Wang, Ming [1 ]
Guo, Dongmei [1 ]
Xia, Wei [1 ]
机构
[1] Nanjing Normal Univ, Sch Phys Sci & Technol, Jiangsu Key Lab Optoelect Technol, Nanjing 210046, Peoples R China
来源
SEMICONDUCTOR LASERS AND APPLICATIONS IV | 2010年 / 7844卷
关键词
VCSEL; SMI; Phase modulation; LASER-DIODE; INTERFEROMETER;
D O I
10.1117/12.870599
中图分类号
TM [电工技术]; TN [电子技术、通信技术];
学科分类号
0808 ; 0809 ;
摘要
The Self-Mixing Interference (SMI) effect of a Vertical-Cavity Surface-Emitting Laser (VCSEL) is studied in this paper. The analysis and experiment are presented to verify the dynamics of the VCSEL. The phenomenon is observed and contrasted with traditional interference phenomenon. The output property of VCSEL is modulated by the change of cavity length and feedback intensity. An interferometer using VCSEL self-mixing based on temporal carrier phase shifting technique is studied. Theoretical analysis and simulation calculations are presented and some errors of this method are discussed.
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页数:7
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