Applying DPPI: A Defect Causal Analysis Approach Using Bayesian Networks

被引:0
作者
Kalinowski, Marcos [1 ]
Mendes, Emilia [2 ]
Card, David N. [3 ]
Travassos, Guilherme H. [1 ]
机构
[1] UFRJ Fed Univ Rio de Janeiro, COPPE, BR-68511 Rio De Janeiro, Brazil
[2] Univ Auckland, Dept Comp Sci, Auckland 92019, New Zealand
[3] Det Norske Veritas, Florida 32937, OH USA
来源
PRODUCT-FOCUSED SOFTWARE PROCESS IMPROVEMENT | 2010年 / 6156卷
关键词
Bayesian Networks; Defect Causal Analysis; Defect Prevention; Defect Prevention-based Process Improvement; DPPI; Product Focused Software Process Improvement; MANAGEMENT;
D O I
暂无
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Defect causal analysis (DCA) provides a means for product-focused software process improvement. A DCA approach, called DPPI (Defect Prevention-based Process Improvement), was assembled based on DCA guidance obtained from systematic reviews and on feedback gathered from experts in the field. According to the systematic reviews, and to our knowledge, DPPI represents the only approach that integrates cause-effect learning mechanisms (by using Bayesian networks) into DCA meetings. In this paper we extend the knowledge regarding the feasibility of using DPPI by the software industry, by describing the experience of applying it end-to-end to a real Web-based software project and providing additional industrial usage considerations. Building and using Bayesian networks in the context of DCA showed promising preliminary results and revealed interesting possibilities.
引用
收藏
页码:92 / +
页数:3
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