On the accuracy of spectrum-based fault localization

被引:467
作者
Abreu, Rui [1 ]
Zoeteweij, Peter [1 ]
van Gemund, Arjan J. C. [1 ]
机构
[1] Delft Univ Technol, Fac Elect Engn Math & Comp Sci, Dept Software Technol, POB 5031, NL-2600 GA Delft, Netherlands
来源
TAIC PART 2007 - TESTING: ACADEMIC AND INDUSTRIAL CONFERENCE - PRACTICE AND RESEARCH TECHNIQUES, PROCEEDINGS: CO-LOCATED WITH MUTATION 2007 | 2007年
关键词
test data analysis; software fault diagnosis; program spectra;
D O I
10.1109/TAIC.PART.2007.13
中图分类号
TP31 [计算机软件];
学科分类号
081202 ; 0835 ;
摘要
Spectrum-based fault localization shortens the test-diagnose-repair cycle by reducing the debugging effort. As a light-weight automated diagnosis technique it can easily be integrated with existing testing schemes. However, as no model of the system is taken into account, its diagnostic accuracy is inherently limited. Using the Siemens Set benchmark, we investigate this diagnostic accuracy as a function of several parameters (Such as quality and quantity of the program spectra collected during the execution of the system), some of which directly relate to test design. Our results indicate that the superior performance of a particular similarity coefficient, used to analyze the program spectra, is largely independent of test design. Furthermore, near-optimal diagnostic accuracy (exonerating about 80% of the blocks of code on average) is already obtained for low-quality error observations and limited numbers of test cases. The influence of the number of test cases is of primary importance for continuous (embedded) processing applications, where only limited observation horizons can be maintained.
引用
收藏
页码:89 / +
页数:2
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