Cross-phase modulation (XPM) and cross-gain modulation (XGM) in a semiconductor optical amplifier (SOA) pumped by assist light were experimentally analyzed. A simple analysis technique for evaluating the XPM separately from the XGM was proposed utilizing a polarization-discriminating delayed interferometer. An initial phase deviation and a gain recovery time in SOA with injecting assist light were quantitatively estimated.
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
Ueno, Y
;
Nakamura, S
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NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
Nakamura, S
;
Tajima, K
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机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
Tajima, K
;
Kitamura, S
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机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
机构:
Kokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, JapanKokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, Japan
Usami, M
;
Tsurusawa, M
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机构:
Kokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, JapanKokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, Japan
Tsurusawa, M
;
Matsushima, Y
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h-index: 0
机构:
Kokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, JapanKokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, Japan
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
Ueno, Y
;
Nakamura, S
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
Nakamura, S
;
Tajima, K
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
Tajima, K
;
Kitamura, S
论文数: 0引用数: 0
h-index: 0
机构:
NEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, JapanNEC Corp Ltd, Optoelect & High Frequency Device Res Labs, Tsukuba, Ibaraki 3050805 305, Japan
机构:
Kokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, JapanKokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, Japan
Usami, M
;
Tsurusawa, M
论文数: 0引用数: 0
h-index: 0
机构:
Kokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, JapanKokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, Japan
Tsurusawa, M
;
Matsushima, Y
论文数: 0引用数: 0
h-index: 0
机构:
Kokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, JapanKokusai Denshin Denwa Co Ltd, Res & Dev Labs, Kamifukuoka, Saitama 356, Japan