Fractal Power Network Based on Plant Vein for Power Integrity

被引：5

作者：

Huang, Hui-Fen ^{[1
]}

Chu, Qing-Xin ^{[1
]}

Xiao, Jian-Kang ^{[2
]}

机构：

[1] S China Univ Technol, Sch Elect & Informat Engn, Guangzhou 510641, Guangdong, Peoples R China

[2] Hohai Univ, Coll Comp & Informat, Changzhou 213020, Peoples R China

来源：

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY | 2010年 / 52卷 / 03期

关键词：

Fractal; power integrity (PI); Swiss cheese" effect; voltage drop; CIRCUITS;

D O I：

10.1109/TEMC.2010.2046643

中图分类号：

TM [电工技术]; TN [电子技术、通信技术];

学科分类号：

0808 ; 0809 ;

摘要：

In this paper, a fractal power network has been proposed. The structure is designed based on leaf vein. The simulated and measured results illustrate that the designed power network has greatly improved noise isolation, resistive and inductive voltage drop, and "Swiss Cheese" effect.

引用

页码：759 / 762

页数：5

共 8 条

[1] Optimal design of microfluidic networks using biologically inspired principles [J].

Barber, Robert W. ;

Emerson, David R. .

MICROFLUIDICS AND NANOFLUIDICS, 2008, 4 (03) :179-191

[2] A novel power plane with integrated simultaneous switching noise mitigation capability using high impedance surface [J].

Kamgaing, T ;

Ramahi, OM .

IEEE MICROWAVE AND WIRELESS COMPONENTS LETTERS, 2003, 13 (01) :21-23

[3] Effects on signal integrity and radiated emission by split reference plane on high-speed multilayer printed circuit boards [J].

Kim, J ;

Lee, H ;

Kim, J .

IEEE TRANSACTIONS ON ADVANCED PACKAGING, 2005, 28 (04) :724-735

[4]

Liu HW, 2004, IEICE T ELECTRON, VE87C, P109

[5] Feature selective validation (FSV) for validation of computational electromagnetics (CEM). Part II - Assessment of FSV performance [J].

Orlandi, Antonio ;

Duffy, Alistair P. ;

Archambeault, Bruce ;

Antonini, Giulio ;

Coleby, Dawn E. ;

Connor, Samuel .

IEEE TRANSACTIONS ON ELECTROMAGNETIC COMPATIBILITY, 2006, 48 (03) :460-467

[6] POWER DISTRIBUTION TECHNIQUES FOR VLSI CIRCUITS [J].

SONG, WS ;

GLASSER, LA .

IEEE JOURNAL OF SOLID-STATE CIRCUITS, 1986, 21 (01) :150-156

[7]

WANG QY, 1999, CHIN J MECH ENG, V18, P271

[8]

Xu Peng, 2005, J APPL PHYS, V100, P1

← 1 →