Analytical approach for soft error rate estimation in digital circuits

被引：43
|
作者：
Asadi, G [1 ]
Tahoori, MB [1 ]
机构：
[1] Northeastern Univ, Dept Elect & Comp Engn, Boston, MA 02115 USA
来源：
2005 IEEE INTERNATIONAL SYMPOSIUM ON CIRCUITS AND SYSTEMS (ISCAS), VOLS 1-6, CONFERENCE PROCEEDINGS | 2005年
关键词：
D O I：
10.1109/ISCAS.2005.1465256
中图分类号：
TM [电工技术]; TN [电子技术、通信技术];
学科分类号：
0808 ; 0809 ;
摘要：
Soft errors due to cosmic rays cause reliability problems during lifetime operation of digital systems, which increase exponentially with Moore's law. The first step in developing efficient soft error tolerant schemes is to analyze the effect of soft errors at the system level. In this work we develop a systematic approach for soft error rate estimation. Experiments on benchmark circuits and comparison of the results with random fault injection (previous work) show that our proposed method is on average 95% accurate while 4-5 orders of magnitude faster.
引用
收藏
页码：2991 / 2994
页数：4
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