Optical properties of conductive ZnO films near infrared frequency

被引：2

作者：

Itoh, T. ^{[1
,2
]}

Matsuyama, K. ^{[1
]}

Shimakawa, K. ^{[2
]}

Orava, J. ^{[3
]}

Wagner, T. ^{[3
]}

Frumar, M. ^{[3
]}

机构：

[1] Gifu Univ, Dept Elect Engn, 1-1 Yanagido, Gifu 5011193, Japan

[2] Gifu Univ, Ctr Innovat Photovolta Syst, Gifu 5011193, Japan

[3] Univ Pardubice, Dept Gen & Inorgan Chem, Pardubice 53210, Czech Republic

来源：

PHYSICA STATUS SOLIDI C: CURRENT TOPICS IN SOLID STATE PHYSICS, VOL 6, SUPPL 1 | 2009年 / 6卷

关键词：

THIN-FILMS; SCATTERING;

D O I：

10.1002/pssc.200881301

中图分类号：

O43 [光学];

学科分类号：

070207 ; 0803 ;

摘要：

To know the optical constants, n and k, in transparent conductive zinc oxide (ZnO) films, both spectroscopic ellipsometry (SE) and reflectance-transmittance (RT) method have been adopted. The optical constants, n and k deduced from the SE are different from those estimated from the RT method. We will discuss these differences through the deduced physical parameters in magnetron sputtered Ga-doped ZnO films. (C) 2009 WILEY-VCH Verlag GmbH & Co. KGaA, Weinheim

引用

页码：S110 / S113

页数：4

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