Enhanced light absorption in nanotextured amorphous thin-film silicon caused by femtosecond-laser materials processing

被引:19
作者
Differt, Dominik [1 ]
Soleymanzadeh, Babak [1 ]
Luekermann, Florian [1 ,2 ]
Strueber, Christian [1 ]
Pfeiffer, Walter [1 ]
Stiebig, Helmut [1 ,2 ]
机构
[1] Univ Bielefeld, Fak Phys, D-33615 Bielefeld, Germany
[2] Univ Bielefeld, Inst Innovat Transfer, D-33615 Bielefeld, Germany
关键词
Femtosecond laser materials processing; Hydrogenated amorphous silicon; Raman spectroscopy; Photon management: photovoltaic devices; CRYSTALLINE SILICON; SPECTROSCOPY; SCATTERING;
D O I
10.1016/j.solmat.2014.10.001
中图分类号
TE [石油、天然气工业]; TK [能源与动力工程];
学科分类号
0807 ; 0820 ;
摘要
Efficient thin-film solar cells balance the reduced absorption occurring in thin absorber layers by means of various photon management strategies that often involve randomly nanotextured interfaces. We report on broadband absorption enhancement in nanotextured amorphous silicon processed by femtosecond laser materials processing. As identified by micro-Raman spectroscopy and surface profilometry, the absorption of a single femtosecond amplifier laser pulse (30 fs, 795 nm, 75 mJ cm(-2)) creates a thin nanotextured micro-crystalline surface layer. Optical microscopy in transmission and reflection geometry reveals a broadband absorption enhancement in the visual spectrum range for the nanotextured area. Scattered light spectroscopy in combination with spectral interferometry indicates that light trapping for about 100 fs is achieved in the femtosecond-laser processed amorphous silicon area and thus is responsible for the observed enhanced absorption and locally enhanced Raman yields. Thus fs-laser materials processing offers an interesting pathway towards advanced photon management in amorphous silicon based thin-film solar cells. (C) 2014 Elsevier B.V. All rights reserved.
引用
收藏
页码:72 / 77
页数:6
相关论文
共 15 条
  • [1] The effect of front ZnO:Al surface texture and optical transparency on efficient light trapping in silicon thin-film solar cells
    Berginski, Michael
    Huepkes, Juergen
    Schulte, Melanie
    Schoepe, Gunnar
    Stiebig, Helmut
    Rech, Bernd
    Wuttig, Matthias
    [J]. JOURNAL OF APPLIED PHYSICS, 2007, 101 (07)
  • [2] BERNHARD CG, 1967, ENDEAVOUR, V26, P79
  • [3] Modifying single-crystalline silicon by femtosecond laser pulses: an analysis by micro Raman spectroscopy, scanning laser microscopy and atomic force microscopy
    Bonse, J
    Brzezinka, KW
    Meixner, AJ
    [J]. APPLIED SURFACE SCIENCE, 2004, 221 (1-4) : 215 - 230
  • [4] Infrared absorption by sulfur-doped silicon formed by femtosecond laser irradiation
    Crouch, CH
    Carey, JE
    Shen, M
    Mazur, E
    Génin, FY
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2004, 79 (07): : 1635 - 1641
  • [5] Key issues for fabrication of high quality amorphous and micro crystalline silicon solar cells
    Kondo, M
    Matsui, T
    Nasuno, Y
    Sonobe, H
    Shimizu, S
    [J]. THIN SOLID FILMS, 2006, 501 (1-2) : 243 - 246
  • [6] Laser Processed Black Silicon for Photovoltaic Applications
    Kontermann, S.
    Gimpel, T.
    Baumann, A. L.
    Guenther, K. -M.
    Schade, W.
    [J]. PROCEEDINGS OF THE 2ND INTERNATIONAL CONFERENCE ON CRYSTALLINE SILICON PHOTOVOLTAICS (SILICONPV 2012), 2012, 27 : 390 - 395
  • [7] Linear techniques of phase measurement by femtosecond spectral interferometry for applications in spectroscopy
    Lepetit, L
    Cheriaux, G
    Joffre, M
    [J]. JOURNAL OF THE OPTICAL SOCIETY OF AMERICA B-OPTICAL PHYSICS, 1995, 12 (12) : 2467 - 2474
  • [8] Tunable nonlinear absorption of hydrogenated nanocrystalline silicon
    Ma, Y. J.
    Oh, J. I.
    Zheng, D. Q.
    Su, W. A.
    Shen, W. Z.
    [J]. OPTICS LETTERS, 2011, 36 (17) : 3431 - 3433
  • [9] Formation of nano-textured conical microstructures in titanium metal surface by femtosecond laser irradiation
    Nayak, B. K.
    Gupta, M. C.
    Kolasinski, K. W.
    [J]. APPLIED PHYSICS A-MATERIALS SCIENCE & PROCESSING, 2008, 90 (03): : 399 - 402
  • [10] MIE SCATTERING AND ROUGH SURFACES
    SCHADE, H
    SMITH, ZE
    [J]. APPLIED OPTICS, 1985, 24 (19): : 3221 - 3226