Nonvolatile Bipolar Resistive Switching Behavior in the Perovskite-like (CH3NH3)2FeCl4

被引:19
作者
Lv, Fengzhen [1 ]
Gao, Cunxu [1 ]
Zhou, Heng-An [1 ]
Zhang, Peng [1 ]
Mi, Kui [1 ]
Liu, Xiaoxing [1 ]
机构
[1] Lanzhou Univ, Key Lab Magnetism & Magnet Mat, Minist Educ, Lanzhou 730000, Peoples R China
基金
中国国家自然科学基金;
关键词
(CH3NH3)(2)FeCl4(MAFC); nonvolatile; bipolar resistive switching behavior; Ag/MAFC/Cu; oxidative reaction; NEGATIVE DIFFERENTIAL RESISTANCE; XPS ANALYSIS; INFORMATION; STORAGE; DEVICE; SILVER; FILMS; ARRAY; CU;
D O I
10.1021/acsami.6b04464
中图分类号
TB3 [工程材料学];
学科分类号
0805 ; 080502 ;
摘要
The bipolar resistive switching behavior in a device based on an crystalline iron-based organic inorganic, perovskite-like material of (CH3NH3)(2)FeCl4 (MAFC), was examined and studied. Both high and low resistance states appeared to have no obvious degradation during a measurement period of 600 s with 400 cycles in a Ag/MAFC/Cu device, which also exhibited good thermal stability over a wide temperature range of 290 to 340 K. The conductivity-state switching behavior was derived from the competition between the ionic current within the MAFC and the Faradaic current that originated from oxidative reactions at the Ag/MAFC/Cu interface. A model explaining the oxidative reaction process was established to describe the symmetric resistive switching behavior in the Ag/MAFC/Cu cell. With an applied bias voltage sweeping, the oxidative layers passivated and dissipated at the Ag/MAFC/Cu interface that resulted in the competition between the induced current and the ionic current, and thus caused a symmetric resistance change. On the basis of this interfacial effect, the MAFC crystals can be used as memristor elements in devices for write-read-erase-rewrite process.
引用
收藏
页码:18985 / 18990
页数:6
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